2022
DOI: 10.1016/j.optmat.2022.112930
|View full text |Cite
|
Sign up to set email alerts
|

Structural, mechanical, thermodynamic, electronic, magnetic and optical properties of ZnFe2O4 ferrite: A DFT study

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
4
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 22 publications
(4 citation statements)
references
References 43 publications
0
4
0
Order By: Relevance
“…The refractive index MFe 2 O 4 (M = Ni, Fe, Co) ferrites specify the rate of light dispersion and transparency. The static refractive index values were found in the ultraviolet and visible regions, which revealed crucial zoon for the solar cells, photocatalytic, and optoelectronic devices [66, 67].…”
Section: Resultsmentioning
confidence: 99%
“…The refractive index MFe 2 O 4 (M = Ni, Fe, Co) ferrites specify the rate of light dispersion and transparency. The static refractive index values were found in the ultraviolet and visible regions, which revealed crucial zoon for the solar cells, photocatalytic, and optoelectronic devices [66, 67].…”
Section: Resultsmentioning
confidence: 99%
“…The reflectivity of the compound exhibited distinct characteristics when subjected to varying energy levels and pressure in the visible region significant drop in reflectivity reached its minimum of approximately 3eV this decrease Suggests Znfe2O4 absorbs a significant portion of incident light within this range .in the energy range of 10-30 eV the reflectivity displayed higher Intensity peaks across all applied pressures which means more reflective at these higher energies. the reflectivity decline in the ultraviolet region within the energy range of 31-42 eV the variation in reflectivity thus suggests that the high sensitivity towards applied pressure [43].…”
Section: Znfe2o4mentioning
confidence: 91%
“…Vacuum space with a height of 10 Å (buffering space for volume expansion of Si atoms during charging and discharging processes) was added between the graphene layer and Si atoms. Before the diffusion process, all structures were optimized using the conjugate gradient method [45][46][47][48][49][50], until the residual force was less than 0.01 eV/Å, the energy change convergence of each atom was less than 10 À5 eV, and the maximum atomic displacement tolerance was less than 1.0 Â 10 À4 nm. At 1200 K, the diffusion process of Li was simulated by ab initio molecular dynamics (AIMD) using the Canonical ensemble (NPT) within the DFT framework.…”
Section: Methodsmentioning
confidence: 99%