“…X-ray diffraction (XRD) patterns of FTO/cp-TiO 2 and FTO/cp-TiO 2 / SAED thin film substrates show that the SAED film is well crystallized with diffraction peaks at 19.9°, 28.4°, 29.3°, 29.9°, and 35.1° corresponding to (011) (−211), (220), (211), and (031) crystal planes, respectively ( Figure 1c). [28] The SAED film was further characterized by energy dispersion spectrum (EDS) mapping spectrum, high-resolution transmission electronic microscopy (HRTEM) and selected area electron diffraction (Figures S3-S5, Supporting Information), which confirmed the existence of Sr, Al, Eu, and Dy elements and the good crystallinity of the film. The SEM top-view image shows the typical crystal structure of CH 3 NH 3 PbI 3−x Cl x films formed on top of the SAED scaffolds with a maximum grain size of 1.8 µm ( Figure S6, Supporting Information).…”