2010
DOI: 10.1016/j.jssc.2010.09.018
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Structural evolution of Na0.5K0.5NbO3 at high temperatures

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Cited by 57 publications
(50 citation statements)
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“…Piezoelectric coefficients are measured with a Berlincourt -d33 -meter (Piezotest PM-200). For the two K0.5Na0.5Nb1-xTaxO3 end members (x = 0) and KNT (x = 1), X-Ray diffraction patterns are consistent with previous studies of Ishizawa et al [43] and with JCPDS K0.5Na0.5NbO3 reference [44]. KNN (x = 0) is found to crystallize in orthorhombic structure with Amm2 space group, while KNT (x = 1) crystallizes in cubic structure with…”
Section: Introductionsupporting
confidence: 88%
“…Piezoelectric coefficients are measured with a Berlincourt -d33 -meter (Piezotest PM-200). For the two K0.5Na0.5Nb1-xTaxO3 end members (x = 0) and KNT (x = 1), X-Ray diffraction patterns are consistent with previous studies of Ishizawa et al [43] and with JCPDS K0.5Na0.5NbO3 reference [44]. KNN (x = 0) is found to crystallize in orthorhombic structure with Amm2 space group, while KNT (x = 1) crystallizes in cubic structure with…”
Section: Introductionsupporting
confidence: 88%
“…Note the distinctive splitting of the (010) and (020) peaks of the parent cubic phase, expanded in Fig. 1(b) [21,22].…”
Section: Methodsmentioning
confidence: 98%
“…1 shows the x-ray diffraction (XRD) patterns of the KNN þ 1 wt% Gd 2 O 3 (KNN1G) thin films grown on the quartz substrate deposited under different OMPs. The Rietveld refinement of KNN1G films was carried out by considering the P4mm space group using FullProf program [28]. In case of 0% OMP, apart from (110) peak; other peaks are also present as shown in Fig.…”
Section: Methodsmentioning
confidence: 99%