“…45,46 Helium diffraction allows in situ measurements even at growth temperature, and is known for its unique sensitivity to adsorbates, including hydrogen atoms. [47][48][49][50][51][52][53][54][55] Furthermore, unlike other established techniques, 56 HAS is completely inert and does not modify the process under investigation. 57 While the specular reflection gives an estimate of adsorbate coverage on the clean surface, the angular distribution provides insight in the time evolution of periodic structures being formed on the surface.…”