1997
DOI: 10.1103/physrevb.56.8265
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Structural effects on the magnetic and transport properties of perovskiteA1xAx

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Cited by 840 publications
(366 citation statements)
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“…This expansion of the cell was required to take into account tilts and rotations of the oxygen octahedra. The small lattice mismatch with respect to STO results in a bulk pseudocubic c/a ratio of 0.998, consistent with what is known from experiment for many of the hole-doped La-manganites 23 .…”
Section: Resultssupporting
confidence: 70%
See 1 more Smart Citation
“…This expansion of the cell was required to take into account tilts and rotations of the oxygen octahedra. The small lattice mismatch with respect to STO results in a bulk pseudocubic c/a ratio of 0.998, consistent with what is known from experiment for many of the hole-doped La-manganites 23 .…”
Section: Resultssupporting
confidence: 70%
“…The zigzag distortions along the [110] and [1][2][3][4][5][6][7][8][9][10] directions observed on the surface cannot originate from the bulk. For this composition (x ¼ 3/8) the in-plane cell is O2a  O2a, where a is the cubic perovskite lattice parameter 23 . Here, the zigzag pattern expands the surface cell to 2O2a  O2a, with the long axis along the zigzag chain, reminiscent of the Jahn-Teller distortions of the charge/orbital order of half-doped LCMO (x ¼ 0.5) (ref.…”
Section: Resultsmentioning
confidence: 99%
“…So the columnar grain size is larger in the film deposited at 1073K than at 873K, which is consistent with the results reported by Wang et al [11,12]. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 The formation of oriented domains of Pnma structure has been largely reported not only in La 1-x R x MnO 3 (R= Ca, Sr or vacancy) thin films [13][14][15][16][17][18][19][20][21][22][23][24][25], but also reported in A 1-x R x MnO 3 ( A=Pr or La; B= Sr or Ca) bulk materials [26,27].…”
Section: Electron Diffraction Patterns and High-resolution Electron Mmentioning
confidence: 99%
“…[9][10][11][12][13] Transmission electron microscopy (TEM) is a powerful tool for characterization of microstructures in materials. In the past few years TEM has been widely applied in the studies of CMR materials, and particularly in thin films of external-doped lanthanum manganites [13][14][15][16][17][18][19][20][21][22][23][24][25][26][27][28]. Van Tendeloo et al [15] Figure 1 shows the low magnification TEM images taken from the crosssectional samples of the two films.…”
Section: Introductionmentioning
confidence: 99%
“…A considerable amount of work has been devoted to bring about the Mn -O -Mn bond angle deformation and subsequent increase of the magnetoresistance by substitutions at the rare earth site [6][7][8][9] . Application of external hydrostatic pressure 10,11 also produces similar effect in the Mn +3 -O -Mn +4 network.…”
Section: Introductionmentioning
confidence: 99%