1954
DOI: 10.1103/physrev.93.891
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Structural Defects in Copper and the Electrical Resistivity Minimum

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1956
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Cited by 31 publications
(10 citation statements)
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“…which agrees with the measurements by Blewitt et al [ 2 ] . Basinski Experiments to check equation ( 2 ) have been made on polycrystalline f.c.c.…”
Section: (3)supporting
confidence: 91%
See 1 more Smart Citation
“…which agrees with the measurements by Blewitt et al [ 2 ] . Basinski Experiments to check equation ( 2 ) have been made on polycrystalline f.c.c.…”
Section: (3)supporting
confidence: 91%
“…4 "K the first double measurement could, however, be made only after annealing a t 90. 2 "K so that in order to determine the resistivity increase immediately after deformation it was necessary to take into account the recovered part of the resistivity, which could be done in a very exact way because of the unchanged geometry of the sample. The values chosen for B were derived from the resistivity decreases up to 290 "K recorded for the respective samples a t both measuring temperatures.…”
Section: A1mentioning
confidence: 99%
“…(55) cold worked high purity single crystal wire of copper and found that the resistance minimum appeared after the wire was annealed and recrystallized. (55) cold worked high purity single crystal wire of copper and found that the resistance minimum appeared after the wire was annealed and recrystallized.…”
Section: Resistivity Minimummentioning
confidence: 99%
“…As expected, the cumulative p, for a given total 6p for Group 2 samples is larger than those for Groups 3 and 4, and the data for e^ = 0.20 and 0.30% strain per cycle give essentially the same cumulative data. Since the stresses to produce e t = 0.30% are considerably larger than those for 0,20%, the near coincidence of the pd-versus-£e p data is further The data of Blewitt et al 12 for tensile loading in single crystals of copper gives n=2 and a=0.1 μ^cm, whereas a review of data from polycrystalline samples 23 concludes that n=* 3/2 and a = 0.05 ^β*cm. The present data for cyclic strains give pj = 0.024 ixfi-cm Se p <82 for the Group 2 texture and p^ = 0.017 μ^cm Se p ' 71 for the (ill) texture.…”
Section: Comparison With Unidirectional Deformationmentioning
confidence: 92%
“…% Frenkel pair. 16 The most definitive data regarding defects produced by plastic deformation of copper at 4.2 K have emerged from the single-crystal studies of Blewitt et al 12 These studies showed that (l) the p^ after deformation at 4.2 K t is dependent on the square of resolved shear stress on the primary glide system, (2) the shear stress to attain a given shear strain is significantly dependent on whether single-or multiple-slip systems are operating, and (3) no significant annealing, or decrease in p^ produced at 4.2 K, occurs at T < 78 K. Points 1 and 2 established the importance of the dislocation interactions, rather than strain alone, in determining the number of point defects. The third point established that the defects were primarily vacancies, since single interstitials should be mobile and thus cause P^ to decrease at T -c 78 K.…”
Section: Defect Resistivitymentioning
confidence: 99%