2020
DOI: 10.1021/acsami.9b17899
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Structural Characterization of Mesoporous Thin Film Architectures: A Tutorial Overview

Abstract: Mesoporous thin film architectures are an important class of materials that exhibit unique properties, which include high surface area, versatile surface functionalization, and bicontinuous percolation paths through a broad library of pore arrangements on the 10 nm length scale. Although porosimetry of bulk materials via sorption techniques is common practice, the characterization of thin mesoporous films with small sample volumes remains a challenge. A range of techniques are geared toward providing informat… Show more

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Cited by 45 publications
(77 citation statements)
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“…Moreover AFM lateral resolution can be affected by tip convolution effects, and therefore some discrepancies between the data obtained by the different techniques may be expected. 50 Nevertheless, a narrower M w distribution of the BCP induced in all cases a lower pore size dispersity in the final mesoporous film. This provides further evidence that the herein presented approach of BCP chromatographic fractionation not only offers a straightforward method to obtain an extensive BCP library with little synthetic effort but also reduced dispersity in inorganic mesoporous films.…”
Section: Resultsmentioning
confidence: 88%
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“…Moreover AFM lateral resolution can be affected by tip convolution effects, and therefore some discrepancies between the data obtained by the different techniques may be expected. 50 Nevertheless, a narrower M w distribution of the BCP induced in all cases a lower pore size dispersity in the final mesoporous film. This provides further evidence that the herein presented approach of BCP chromatographic fractionation not only offers a straightforward method to obtain an extensive BCP library with little synthetic effort but also reduced dispersity in inorganic mesoporous films.…”
Section: Resultsmentioning
confidence: 88%
“…Sample analysis by AFM is limited to the surface topography and, thus, alternative characterization techniques are required to evaluate the obtained results. 50 To this end, ellipsometric porosimetry (EP) has emerged as a reliable characterization technique to probe porosity, pore size and pore morphology of thin films. 50 Fig.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…10.9±1.4 nm for A19, 12.3±1.5 nm for A18 and 14.8±1.6 nm for A17, and with significantly reduced pore dispersity when compared to the non-fractionated BCP (13.0±3.6). Sample analysis by AFM is limited to the surface topography and, thus, alternative characterization techniques are required to evaluate the obtained results [46] . To this end, ellipsometric porosimetry (EP) has emerged as a reliable characterization technique to probe porosity, pore size and pore morphology of thin films.…”
Section: Resultsmentioning
confidence: 99%
“…To this end, ellipsometric porosimetry (EP) has emerged as a reliable characterization technique to probe porosity, pore size and pore morphology of thin films. [46] Figure 4 (left column) shows the EP adsorption isotherms obtained for the respective samples. Please note that the films exhibited a porosity in the range of 47% to 54%.…”
Section: Resultsmentioning
confidence: 99%