“…Some new small peaks corresponding to (220) and (211) orientations are also observed for annealed films which might be an indication of phase change at higher annealing temperature. The results are in agreement with the earlier reported work by other authors [3,5,10]. The crystallographic parameters like lattice constant (a), inter planner spacing (d), grain size (D), internal strain (ε), dislocation density (δ) and number of crystallites per unit area (N) were calculated using relations concerned [15,16] and tabulated in Table 1.…”