Structural and Stoichiometry Change in NiO with a Thin IrO2 Layer

Kim, C.; Cho, E.; Yoon, Seokhyun; Kim, D.; Jung, Roland; Lee, Chang-Won; Seo, Sunae; Cheong, Hyeonsik; Bastjan, M.; Schulz, Benjamin; Rübhausen, Michael

doi:10.3938/jkps.53.3390

Cited by 2 publications

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“…The Ni oxide film displays a similar absorption at the shortest wavelengths, but it is clearly seen that the band edge is smeared so that a band tail exists. This absorption onset is roughly exponential, i.e., it can be described as an Urbach tail [32]. For fitting purposes-as will be apparent later-this low energy tail was instead represented by a Lorentzian model of the interband absorption.…”

Section: Preliminary Optical Characterizationmentioning

confidence: 99%

“…A third reason is that the optical properties of the pure oxides serve as starting points for understanding the EC performance of mixed W-Ni oxides which, as shown recently [15], can exhibit superior optical properties. Spectroscopic ellipsometry (SE) is the technique par preférénce to investigate the optical properties [16], and, not surprisingly, it has been used in the past for detailed studies on EC films of W oxide made by evaporation [17][18][19][20][21], sputter deposition [22][23][24][25][26][27][28][29], and sol-gel technology [30], as well as EC films of Ni oxide made by pulsed laser deposition [31], sputtering [23,25,32,33], atomic layer deposition [34], and sol-gel technology [35].…”

Section: Introductionmentioning

confidence: 99%

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Spectroscopic ellipsometry characterization of electrochromic tungsten oxide and nickel oxide thin films made by sputter deposition

Valyukh

Green

Arwin

et al. 2010

Solar Energy Materials and Solar Cells

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This is an author produced version of a paper published in Solar Energy Materials and Solar Cells. This paper has been peer-reviewed but does not include the final publisher proof-corrections or journal pagination. 2 AbstractElectrochromic films of tungsten oxide and nickel oxide were made by reactive dc magnetron sputtering and were characterized by X-ray diffraction, Rutherford backscattering spectrometry, scanning electron microscopy, and atomic force microscopy. The optical properties were investigated in detail by spectroscopic ellipsometry and spectrophotometry, using a multiple-sample approach. The W oxide film was modeled as a homogeneous isotropic layer, whereas the Ni oxide film was modeled as an anisotropic layer with the optical axis perpendicular to the surface. Parametric models of the two layers were then used to derive complex refractive index in the 300-1700-nm-range, film thickness, and surface roughness. A band gap of 3.15 eV was found for the W oxide film, using a Tauc-Lorentz parameterization. For the Ni oxide film, taken to have direct optical transitions, band gaps along the optical axis, perpendicular to it, and in an isotropic intermediate layer at the bottom of the film were found to be 3.95, 3.97, and 3.63 eV, respectively. Parameterization for the Ni oxide was made by use of the Lorentz model.

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Section: Preliminary Optical Characterizationmentioning

confidence: 99%