2006
DOI: 10.1016/j.sse.2006.04.039
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Structural and rectifying junction properties of self-assembled ZnO nanoparticles in polystyrene diblock copolymers on (100)Si substrates

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Cited by 5 publications
(2 citation statements)
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“…The photolithographic procedure was also followed in order to determine the mass sensitivity of the sensors using a well-characterized diblock copolymer for mass measurements. The polystyrene-polyacrylic acid copolymer is well-characterized with a density of 1.077 g/cc (Ali et al, 2006), and was developed in a solvent of tetra-hydro-fluoride (THF) for spin cast application on the sensors. After the windows were opened, the copolymer was spin cast on the sample surface and was allowed to settle before the photoresist was lifted-off in order to form the 5 m × 5m and 20 m × 20 m windows consisting of the copolymer film only.…”
Section: Sensor Fabricationmentioning
confidence: 99%
“…The photolithographic procedure was also followed in order to determine the mass sensitivity of the sensors using a well-characterized diblock copolymer for mass measurements. The polystyrene-polyacrylic acid copolymer is well-characterized with a density of 1.077 g/cc (Ali et al, 2006), and was developed in a solvent of tetra-hydro-fluoride (THF) for spin cast application on the sensors. After the windows were opened, the copolymer was spin cast on the sample surface and was allowed to settle before the photoresist was lifted-off in order to form the 5 m × 5m and 20 m × 20 m windows consisting of the copolymer film only.…”
Section: Sensor Fabricationmentioning
confidence: 99%
“…The intensity of this peak increased slightly after ion irradiation, which was insignificant for structural modifications. The prominent peaks observed at 35.35°, 39.44°and 53.73°are attributed to (0 0 2), (1 0 0) and (1 0 3) respectively, these peaks attribute the formation of ZnS nanoparticles and Zn blende structure [3,21]. The shift of the absorption peak towards longer wavelength was observed due to the formation of conjugated system of bonds after ion irradiation [22][23][24].…”
Section: Structural Studies By X-ray Diffractionmentioning
confidence: 99%