2014
DOI: 10.1007/s10854-014-1781-x
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Structural and optoelectronic properties of indium doped SnO2 thin films deposited by sol gel technique

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Cited by 37 publications
(10 citation statements)
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“…The RF sputtering process has an approximately 3-fold lower deposition rate (20 nm/min) compared to DC sputtering (60 nm/min) for an equivalent power density of 50 W as observed in this work. The slower deposition rate of RF sputtering leads to better crystalline properties of ITO films compared to the DC-sputtered films. , The improvement in crystallinity is known to result in the reduction of lattice defects such as strain and dislocation density, which are regarded as scattering centers. , Hence, the RF-deposited ITO thin films have shown improved transmittance compared to DC-sputtered films.…”
Section: Resultsmentioning
confidence: 99%
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“…The RF sputtering process has an approximately 3-fold lower deposition rate (20 nm/min) compared to DC sputtering (60 nm/min) for an equivalent power density of 50 W as observed in this work. The slower deposition rate of RF sputtering leads to better crystalline properties of ITO films compared to the DC-sputtered films. , The improvement in crystallinity is known to result in the reduction of lattice defects such as strain and dislocation density, which are regarded as scattering centers. , Hence, the RF-deposited ITO thin films have shown improved transmittance compared to DC-sputtered films.…”
Section: Resultsmentioning
confidence: 99%
“…44-1087). The absence of Sn, SnO, and SnO 2 characteristic peaks in all the spectra can be attributed to the complete miscibility of Sn atoms in the In 2 O 3 lattice …”
Section: Resultsmentioning
confidence: 99%
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“…The kurtosis value greater than 3 implies that surface height distribution is not Gaussian-like, which implies relatively spiky surfaces. 37,38 Comparing the skewness and kurtosis value of both surfaces, it is obvious that the TZPPF surface is more spiky with dominant peaks compared to the TZP surface. Thus, the FESEM and AFM studies together confirm the bimodal porous structure of the TZPPF film.…”
Section: Resultsmentioning
confidence: 99%