2003
DOI: 10.1016/s0254-0584(02)00089-5
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Structural and optical properties of spray-deposited CdIn2Se4 thin films

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Cited by 36 publications
(16 citation statements)
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“…It is observed that crystallite size increases initially with increase in substrate temperature reaches the maximum 33 nm at 475 • C and thereafter it goes on decreasing with increase in substrate temperature. Increase in crystallinity and crystallite size with substrate temperature is due to the optimum rate of supply of thermal energy for recrystallization with substrate temperature [27]. The values of crystallite size for different substrate temperatures are shown in Table 1.…”
Section: Structural Propertiesmentioning
confidence: 99%
“…It is observed that crystallite size increases initially with increase in substrate temperature reaches the maximum 33 nm at 475 • C and thereafter it goes on decreasing with increase in substrate temperature. Increase in crystallinity and crystallite size with substrate temperature is due to the optimum rate of supply of thermal energy for recrystallization with substrate temperature [27]. The values of crystallite size for different substrate temperatures are shown in Table 1.…”
Section: Structural Propertiesmentioning
confidence: 99%
“…In recent years, there is much interest in the preparation and characterization of chalcogenide thin films because of their potential applications in the various fields [1][2][3][4]. Semiconducting chalcogenide glasses have been studied since the 60s of the last century and have reached now the stage of practical applications in several technological fields because of their promising properties which make them useful as materials for infrared optical fibers, recording layer materials in optical phase change technique, optoelectronic circuits, magnetic sensors and more recently in the development of ovonic unified memory [5][6][7].…”
Section: Introductionmentioning
confidence: 99%
“…As it can be seen the diffraction peaks were Increase in crystallinity with substrate temperature is may be due to the optimum rate of supply of thermal energy for recrystallization with substrate temperature as reported by Nikale et al [23].…”
Section: -1 X-ray Diffraction Studiesmentioning
confidence: 58%