2008
DOI: 10.1016/j.mseb.2007.09.042
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Structural and optical properties of high density Si-ncs synthesized in SiNx:H by remote PECVD and annealing

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Cited by 23 publications
(26 citation statements)
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“…Indeed, according to the images Si-nps are separated from each other by about 1 nm. This distance is favorable for the achievement of good electrical transport properties based on the tunneling probability in a SiO 2 matrix, as referred by Conibeer et al 20 Furthermore, contrary to other works, 21,22 no coalescence between Si-nc or percolation effects were observed, which attest of the quality of the fabricated MLs and the precise control of the excess Si permitted by the reactive process. The optoelectronical properties of these samples were investigated, in order to correlate them to the structural characteristics.…”
Section: Resultsmentioning
confidence: 87%
“…Indeed, according to the images Si-nps are separated from each other by about 1 nm. This distance is favorable for the achievement of good electrical transport properties based on the tunneling probability in a SiO 2 matrix, as referred by Conibeer et al 20 Furthermore, contrary to other works, 21,22 no coalescence between Si-nc or percolation effects were observed, which attest of the quality of the fabricated MLs and the precise control of the excess Si permitted by the reactive process. The optoelectronical properties of these samples were investigated, in order to correlate them to the structural characteristics.…”
Section: Resultsmentioning
confidence: 87%
“…The latter allows us to describe silicon oxide and nitride as SiO x and and SiN x with x < 2 and x < 1.33 respectively. The low temperature deposition gives rise to formation of silicon nanoclusters and/or nanocrystals in both materials due to the fact that Si excess is high and the phase separation mechanism is not nucleation and growth as in the case of low Si excess, but spinodal decomposition (Carrada 2008). Fig.3a shows clearly the percolation of nanocrystal after 1 min annealing at 1000 •C under Ar ambient.…”
mentioning
confidence: 97%
“…Τα υμένια νιτριδίου του πυριτίου που εναποτίθενται στους διακόπτες RF MEMS δεν είναι κρυσταλλικά αλλά άμορφα και αποκλίνουν από τη στοιχειομετρία (συνήθως με περίσσεια πυριτίου) [80], [81], [82], [83], γι' αυτό και το άμορφο νιτρίδιο του πυριτίου θα αναφέρεται στη συνέχεια ως SiNx.…”
Section: η δομήunclassified
“…Τα άμορφα υμένια SiNx έχει βρεθεί ότι εμφανίζουν νανοσυμπλέγματα πυριτίου (Si nanoclusters) [80] (Σχήμα 2.10) και ελεύθερους δεσμούς Si και N στο πλέγμα τους.…”
Section: κεφαλαιο 2: ηλεκτρικες ιδιοτητες λεπτων μονωτικων υμενιωνunclassified
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