“…The value of D increases with increase of annealing temperature. The dislocation density, lattice strain, micro strain, and stacking fault for the present series samples are extracted from d = 1/D 2 (Sathyamoorthy et al 2006;Sharma et al 2011;Touati et al 2014;Bindu and Thomas 2014), e = b/ 4 9 tanh (Thool et al 2014), e = b 9 cosh/4 (Sathyamoorthy et al 2006;Sharma et al 2011) and SF = 2p 2 /45H(3tanh) (Touati et al 2014;Thool et al 2014), respectively, and their values are given in Table 1. From Table 1 we notice that the dislocation density, lattice strain, micro strain, and stacking fault for the annealed samples decrease with the increase of annealing temperature.…”