2017
DOI: 10.1007/s10854-017-8417-x
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Structural and optical characterization of stacked MoS2 nanosheets by hydrothermal method

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Cited by 13 publications
(4 citation statements)
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“…X-ray Diffraction of MoS 2 powder crystal and exfoliated MoS 2 through bath and probe sonication was performed at room temperature in the 2θ range between 5 and 80°. As reported previously in ref ( 25 ), the intensity of the (002) peak after exfoliation is lower than in the bulk material due to the exfoliation process. From Figure 2 , and after compensating for the instrument effect, we extracted the interplanar distance “ d ” of the (002) plane using the PDF card number 00-037-1492 and the Bragg equation d = n λ/2 sin θ, where “ d ” represents the atomic plane spacing, “ n ” stands for the diffraction order, “λ” denotes the incident radiation wavelength, and “θ” signifies the diffraction angle.…”
Section: Resultssupporting
confidence: 82%
“…X-ray Diffraction of MoS 2 powder crystal and exfoliated MoS 2 through bath and probe sonication was performed at room temperature in the 2θ range between 5 and 80°. As reported previously in ref ( 25 ), the intensity of the (002) peak after exfoliation is lower than in the bulk material due to the exfoliation process. From Figure 2 , and after compensating for the instrument effect, we extracted the interplanar distance “ d ” of the (002) plane using the PDF card number 00-037-1492 and the Bragg equation d = n λ/2 sin θ, where “ d ” represents the atomic plane spacing, “ n ” stands for the diffraction order, “λ” denotes the incident radiation wavelength, and “θ” signifies the diffraction angle.…”
Section: Resultssupporting
confidence: 82%
“…Further, the interplanar spacing was calculated using the Bragg equation, 61 2 d sin θ = nλ , where d is the interplanar spacing, θ is the Bragg diffraction angle, n is the diffraction order (here, 1), and λ is the wavelength of the Cu Kα X-rays (1.54 Å). The calculated interplanar spacings for the four characteristic planes (002), (100), (103), and (110) are 0.619, 0.27, 0.22, and 0.15 nm respectively.…”
Section: Resultsmentioning
confidence: 99%
“…59 It is important to note that the lower intensity of the (002) diffraction peak indicated a low stacking height, which is vital for providing more active sites for electrochemical measurements. 60 Further, the interplanar spacing was calculated using the Bragg equation, 61 2d sin y = nl, where d is the interplanar spacing, y is the Bragg diffraction angle, n is the diffraction order (here, 1), and l is the wavelength of the Cu Ka X-rays (1.54 Å). The calculated interplanar spacings for the four characteristic planes (002), (100), (103), and (110) are 0.619, 0.27, 0.22, and 0.15 nm respectively.…”
Section: Characterization Of Mos 2 Nanosheets and Mos 2 -Pda Nanocomp...mentioning
confidence: 99%
“…Two-dimensional (2D) layered transition metal dichalcogenides (TMDCs) have garnered considerable attentions in recent years due to their unique structures and optoelectronic properties, such as layer-dependent band structures, large exciton binding energies, strong light-matter interactions, and so on [1][2][3][4][5][6][7][8]. Significant efforts including hydrothermal method, mechanical exfoliation, liquid-phase exfoliation and chemical vapor deposition (CVD) method have been proposed to prepare TMDCs [9][10][11][12][13]. Among which, CVD technique is considered as one of the most promising methods for synthesizing TMDCs with large-area, controllable thickness, and high quality.…”
Section: Introductionmentioning
confidence: 99%