2010
DOI: 10.1016/j.surfcoat.2010.08.149
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Structural and morphological characterization WCxNy thin films grown by pulsed vacuum arc discharge in an argon–nitrogen atmosphere

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Cited by 10 publications
(6 citation statements)
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“…Crystalline structure, microstructural, morphological and chemical characterisation 200) and ( 220) planes towards to lower diffraction angles are followed by a higher carbon concentration in the gas mixture during the deposition process. Titanium carbonitride structures are described in many works as a solid solution of TiC and TiN phases [12][13][14][15]. That is because the diffraction peaks of TiC, TiN and TiCN are near and, consequently, they are hard to be distinguished by XRD [8,14,16].…”
Section: Resultsmentioning
confidence: 99%
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“…Crystalline structure, microstructural, morphological and chemical characterisation 200) and ( 220) planes towards to lower diffraction angles are followed by a higher carbon concentration in the gas mixture during the deposition process. Titanium carbonitride structures are described in many works as a solid solution of TiC and TiN phases [12][13][14][15]. That is because the diffraction peaks of TiC, TiN and TiCN are near and, consequently, they are hard to be distinguished by XRD [8,14,16].…”
Section: Resultsmentioning
confidence: 99%
“…Titanium carbonitride structures are described in many works as a solid solution of TiC and TiN phases [12][13][14][15]. That is because the diffraction peaks of TiC, TiN and TiCN are near and, consequently, they are hard to be distinguished by XRD [8,14,16]. The quantification of crystalline phases that constitute this solid solution can be estimated by application of the Vegard's law [14,17].…”
Section: Resultsmentioning
confidence: 99%
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“…Nevertheless, another EDS analysis, previously reported in Ref. [44], shows the presence of small quantities (between 2 and 5%) of elements that are different from the substrate and belong not only to the target (W and C) but also to the gas (N) and surface contamination (O); furthermore, the XRD results for this case do not present strong evidence of an amorphous phase formation, which normally is displayed as shoulders in the diffractograms. The low density of coating possibly produces peaks of crystalline phases or amorphous components that exhibit lower intensities compared with those belonging to the substrate, making their identification difficult.…”
Section: Structure Analysismentioning
confidence: 50%
“…They found that two different phases, a-WCN (hexagonal) and b-WCN (fcc), appeared depending on the different conditions. Recently, Ospina et al 20,25 prepared WCN with pulsed vacuum arc PVD using a WC target with nitrogen gas to study the phase evolution and analyse the chemical state of the WC x N y layers. They found that the phase transformation and the polycrystallinity depended on the number of pulses, N ¼ C ¼ N, C-C, C ¼ C, C-N and C ¼ N bonds existed in films and obtained a low hardness (lower than 15 GPa).…”
Section: Introductionmentioning
confidence: 99%