Structural and Magnetic Ordering of Chromium in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>Ag</mml:mi><mml:mi>/</mml:mi><mml:mi>Cr</mml:mi></mml:math>Multilayers

Demuynck, S.; Meersschaut, Johannes; Dekoster, J; Swinnen, Bart; Moons, R; Vantomme, André; Cottenier, Stefaan; Rots, M.

doi:10.1103/physrevlett.81.2562

Cited by 29 publications

(20 citation statements)

References 12 publications

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“…This stabilization phenomenon is often thought to be associated with strains and imperfections in the sample. 28,29 However, our structural investigations do not support this explanation. Alternatively we suggest that the stabilization is due to the influence of the electronic boundary conditions.…”

Section: Discussioncontrasting

confidence: 76%

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Onset of spin-density-wave antiferromagnetism inCr∕Vmultilayers

et al. 2007

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Spin-density-wave ͑SDW͒ magnetism in a series of Cr/ V heterostructures with different Cr thicknesses was systematically investigated by combined resistivity, neutron, and synchrotron scattering measurements. We show that the onset of the bulklike SDW state comes through several necessary steps from a paramagnetic state through a commensurate SDW to an incommensurate SDW. The Néel temperature for the incommensurate SDW is found to scale with Cr thickness and reaches the bulk value at a Cr thickness of about 2000 Å. The proximity effect from Cr/ V interfaces is found to lead to ͑i͒ the appearance of a 50-Å magnetically dead Cr layer near Cr/ V interfaces and ͑ii͒ suppression of the spin-flip transition and stabilization of a single-domain SDW with out-of-plane spins and out-of-plane propagation wave vector. Finally, we show that the SDW period increases with decreasing Cr thickness and becomes temperature independent in sufficiently thin Cr layers.

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Section: Discussioncontrasting

confidence: 76%

“…For example, stabilization of single-domain longitudinal SDWs in Cr/ Ag multilayers 28 and transverse ones in Fe/ Cr multilayers 10,29 has been reported on. This stabilization phenomenon is often thought to be associated with strains and imperfections in the sample.…”

Section: Discussionmentioning

confidence: 98%

Onset of spin-density-wave antiferromagnetism inCr∕Vmultilayers

et al. 2007

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“…3 The particular magnetic structure of a Cr film depends on such parameters as the Cr-layer thickness ͑t Cr ͒, the adjacent layer materials, and the roughness of the interfaces. [3][4][5][6][7][8] Investigation of the magnetism of ultrathin Cr layers is not only important for their applications but also for general understanding of the interplay between the nanoscale structure and magnetic properties.…”

Section: Introductionmentioning

confidence: 99%

“…[3][4][5][6][7][8] However, many results contradict each other, especially when the Cr layer is very thin ͑t Cr Ͻ 5 nm͒. These discrepancies may be caused by different qualities of surfaces and interfaces resulting from the details of the microscopic defect structure-i.e., the spatial distribution of steps and screw dislocations.…”

Section: Introductionmentioning

confidence: 99%

Surface magnetic structure of epitaxial Cr(001) films on Au(001) studied by spin-polarized scanning tunneling spectroscopy

et al. 2005

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We have studied surface magnetic structure of ultrathin Cr͑001͒ films on Au͑001͒ at room temperature by using spin-polarized scanning tunneling spectroscopy. Spatially resolved maps of the magnetic differential conductivity signal measured with Fe-coated W tips exhibit the following features: ͑1͒ Topological antiferromagnetic order appears in a series of adjacent terraces. ͑2͒ Domains exist with different quantization axes. ͑3͒ Narrow domain walls ͑ϳ6 nm͒ are found near screw dislocations. Feature ͑2͒ may be determined by the effective uniaxial anisotropy induced by the step direction. Feature ͑3͒ can be explained by considering the shorter distance between screw dislocations than the exchange length ͑ϳ120 nm͒ as a result of high-density dislocations in the Cr films.

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“…Besides, the calculations do not take into account the strain present in the thin films. Such a strain is typically observed in epitaxially grown ultrathin films 36,37 and is found to influence the PDOS. 14,15…”

Section: Resultsmentioning

confidence: 82%