2015
DOI: 10.1016/j.mssp.2014.10.029
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Structural and electrical resistivity characteristics of vacuum arc ion deposited zirconium nitride thin films

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Cited by 21 publications
(13 citation statements)
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“…For instance, Abdallah et al [10] reported that the maximal hardness was obtained at V N concentration of 9% and Huang et al [11] got the maximal hardness at V N concentration of 20%. Similarly, the resistivity of ZrN x film was also reported to reach its bottom at the specific substoichiometric point such as V N concentration of 21% by Khan et al [12]. However, the unusual mechanical and electrical properties behaviors were often attributed to the influence of conventional microstructural features, such as preferred orientation, residual stress and grain size [10][11][12].…”
Section: Introductionmentioning
confidence: 85%
“…For instance, Abdallah et al [10] reported that the maximal hardness was obtained at V N concentration of 9% and Huang et al [11] got the maximal hardness at V N concentration of 20%. Similarly, the resistivity of ZrN x film was also reported to reach its bottom at the specific substoichiometric point such as V N concentration of 21% by Khan et al [12]. However, the unusual mechanical and electrical properties behaviors were often attributed to the influence of conventional microstructural features, such as preferred orientation, residual stress and grain size [10][11][12].…”
Section: Introductionmentioning
confidence: 85%
“…For example, Lee et al [26] and Kobayashi and Doi [27] observed a change from (002) into (111) and then into (220) with increasing bias voltage. Similarly, Pastalas et al [28] and Khan et al [29] reported a change from (002) to (111).…”
Section: Resultsmentioning
confidence: 83%
“…5. The as-grown films spectrum indicates a broad band centered at 689 cm À 1 corresponding to stretching vibrations of Zr-N simple bonds [7,13]. The spectrum also depicts a band for ZrO 2 at 1040 cm À 1 , which appears due to thin oxide layer formed on ZrN surface.…”
Section: Ftir Spectroscopic Analysismentioning
confidence: 91%
“…The details of the synthesis chamber and fabrication method are reported elsewhere [7]. The as-grown ZrN films were irradiated with C ions beam in a 5UDH-Pelletron accelerator.…”
Section: Methodsmentioning
confidence: 99%