Structural and electrical properties of magnetron sputtered Ti(ON) thin films: The case of TiN doped in situ with oxygen

Effects of N2 pressure on the structural and electrical properties of tin films deposited by laser molecular beam epitaxy

“…Therefore an oversaturated metastable solution of nitrogen in titanium is formed, and the diffraction peak shifting is thus a consequence of this progressive increase of N interstitials in octahedral Ti sites, resulting in lattice distortion of TiN films. These findings were also reported in TiN fi lms prepared by reactive magnetron sputtering [10] and reactive ion beam assisted deposition [11] . Fig.4 shows EBSD scan of TiN film deposited at 0.1 Pa. A single-crystal film has been detected which is confi rmed by the pole fi gure only exhibiting the (100) orientation.…”

Facile preparation of mesoporous titanium nitride microspheres as novel adsorbent for trace Cd2+ removal from aqueous solution

“…Furthermore, it can be clearly seen that the intensity of the Ti 2p 3/2 XPS peak from TiN is far weaker than those of corresponding oxide or oxynitride, but no TiO 2 or TiO x N y is detected from the XRD pattern. This case is often common in reported studies, and can be attributed to inevitable surface passivation with atmospheric oxygen before the XPS measurement [10,22]. Therefore, from the XPS spectrum it can be seen that TiN, together with oxynitride and amorphous TiO 2 formed during air exposure all are present on the surface of the TiN sample.…”

Preparation of TiOxNy/TiN composites for photocatalytic hydrogen evolution under visible light

“…2b. [22][23][24][25] The existence of TiO 2 is attributed to the reaction of TiN and TiO x N y particles with oxygen from air atmosphere.From the XPS spectra of N 1s (Fig. With the nitridation time is extended to 4-5h, all the characteric peaks are indexed to be that of TiN.…”