Structural and Electrical Characterization of Ag(Ta0.5Nb0.5)O3 and Ag(Ta0.8Nb0.2)O3 Ceramics

Lee, Ku-tak; Yun, Seok-Woo; Koh, Jung‐Hyuk

doi:10.3938/jkps.59.2478

Cited by 3 publications

(2 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The calculated lattice parameters c and a of the Ag(Ta 0.8 Nb 0.2 )O 3 ceramics were 3.957 Å and 3.937 Å. According to these lattice parameters, we suppose that these ATN ceramics have perovskite structure with a pseudo-cubic system [12]. Figure 2 illustrates the temperature dependent resistivity of the Ag(Ta 0.8 Nb 0.2 )O 3 ceramics.…”

Section: Resultsmentioning

confidence: 99%

See 1 more Smart Citation

The Electrical Characterization and Relaxation Behavior of Ag(Ta_0.8Nb_0.2)O₃Ceramics

Kim¹,

Kim²,

Jeong³

et al. 2014

Transactions on Electrical and Electronic Materials

Self Cite

View full text Add to dashboard Cite

Ag(Ta,Nb)O 3 materials have a perovskite structure with a low loss tangent. These materials have been widely researched for their applications as high-frequency, passive components. Also, Ag(Ta,Nb)O 3 materials have weak frequency dispersion with high dielectric permittivity which gives them enormous potential for use in electronic components, including the filters, and embedded capacitors. Therefore, our research will discuss the structural and electrical relaxation properties of Ag(Ta 0.8 Nb 0.2 )O 3 ceramics for device applications. We will investigate using X-ray diffraction to understand their structural properties and will analyze voltage dependent leakage current and timedependent relaxation behavior to understand their material properties.

show abstract

Section: Resultsmentioning

confidence: 99%

“…From this point view, we analyze the characteristics of the various compositions of ATN ceramics. [12]. The refined powder size was of around 127 μm.…”

Section: Introductionmentioning

confidence: 99%

The Electrical Characterization and Relaxation Behavior of Ag(Ta_0.8Nb_0.2)O₃Ceramics

Kim¹,

Kim²,

Jeong³

et al. 2014

Transactions on Electrical and Electronic Materials

Self Cite

View full text Add to dashboard Cite

show abstract

Dielectric Properties and AC Conductivity of Ag(Ta,Nb)O₃Ceramics

Lee¹,

Koh²

2012

Ferroelectrics

View full text Add to dashboard Cite

An Investigation on the Dielectric and Microwave Properties of Ag(Ta,Nb)O₃Thick Films on the Alumina Substrates

Lee¹,

Koh²

2011

Journal of the Korean Institute of Electrical and Electronic Ma

View full text Add to dashboard Cite

Perovskite niobates and tantalates have been placed on a short list of functional materials for future technologies. This article was investigated ferroelectric materials Ag(Ta,Nb)O3 thick film. In this study, we have fabricated the Ag(Ta,Nb)O3 thick film on the Al2O3 substrates by screen printing method.The Ag(Ta,Nb)O3 thick film were fabricated by the mixed oxide method. The sintering temperature and time were 1,150℃, 2 hr. The electrical properties of Ag(Ta,Nb)O3 thick film were investigated at 30∼100℃.

show abstract

Structural and Electrical Characterization of Ag(Ta0.5Nb0.5)O3 and Ag(Ta0.8Nb0.2)O3 Ceramics

Cited by 3 publications

References 0 publications

The Electrical Characterization and Relaxation Behavior of Ag(Ta_0.8Nb_0.2)O₃Ceramics

The Electrical Characterization and Relaxation Behavior of Ag(Ta_0.8Nb_0.2)O₃Ceramics

Dielectric Properties and AC Conductivity of Ag(Ta,Nb)O₃Ceramics

An Investigation on the Dielectric and Microwave Properties of Ag(Ta,Nb)O₃Thick Films on the Alumina Substrates

Contact Info

Product

Resources

About

Structural and Electrical Characterization of Ag(Ta0.5Nb0.5)O3 and Ag(Ta0.8Nb0.2)O3 Ceramics

Cited by 3 publications

References 0 publications

The Electrical Characterization and Relaxation Behavior of Ag(Ta0.8Nb0.2)O3Ceramics

The Electrical Characterization and Relaxation Behavior of Ag(Ta0.8Nb0.2)O3Ceramics

Dielectric Properties and AC Conductivity of Ag(Ta,Nb)O3Ceramics

An Investigation on the Dielectric and Microwave Properties of Ag(Ta,Nb)O3Thick Films on the Alumina Substrates

Contact Info

Product

Resources

About

The Electrical Characterization and Relaxation Behavior of Ag(Ta_0.8Nb_0.2)O₃Ceramics

The Electrical Characterization and Relaxation Behavior of Ag(Ta_0.8Nb_0.2)O₃Ceramics

Dielectric Properties and AC Conductivity of Ag(Ta,Nb)O₃Ceramics

An Investigation on the Dielectric and Microwave Properties of Ag(Ta,Nb)O₃Thick Films on the Alumina Substrates