1999
DOI: 10.1002/(sici)1521-3951(199912)216:2<817::aid-pssb817>3.0.co;2-6
|View full text |Cite
|
Sign up to set email alerts
|

Structural Analysis of Intrinsic Defects in GaAs and AlxGa1?xAs by Magnetooptically Detected Magnetic Resonance Spectroscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
8
0

Year Published

2003
2003
2016
2016

Publication Types

Select...
5
1
1

Relationship

1
6

Authors

Journals

citations
Cited by 23 publications
(9 citation statements)
references
References 76 publications
(135 reference statements)
0
8
0
Order By: Relevance
“…33 As to ESR, one tenaciously defended discrimination appears to have been reached regarding two occurring variants, the isolated As Ga þ and the As Ga þ -As i complex, where As i represents an As interstitial at a second nearest interstitial site T d2 . 26,29 The latter complex has been identified with the electrically well known EL2 deep double donor center, with the þþ/þ and þ/0 charge transition levels at 0.54 and 0.75 eV above the valence band top E vb , respectively. It is responsible for the semi insulating properties of as-grown GaAs, and figures as main culprit in causing Fermi level pinning at GaAs/insulator interfaces.…”
mentioning
confidence: 76%
See 3 more Smart Citations
“…33 As to ESR, one tenaciously defended discrimination appears to have been reached regarding two occurring variants, the isolated As Ga þ and the As Ga þ -As i complex, where As i represents an As interstitial at a second nearest interstitial site T d2 . 26,29 The latter complex has been identified with the electrically well known EL2 deep double donor center, with the þþ/þ and þ/0 charge transition levels at 0.54 and 0.75 eV above the valence band top E vb , respectively. It is responsible for the semi insulating properties of as-grown GaAs, and figures as main culprit in causing Fermi level pinning at GaAs/insulator interfaces.…”
mentioning
confidence: 76%
“…As it appears, distinguishing between the types on pure ESR basis (g, a iso, DB pp ) is not straightforward. 26,31 As advanced, the most discriminating criterion advanced would be the dissimilar photosensitivity of the different variants of As Ga -centered defects, i.e., the 1.1 eV photoquenching of the EL2 center and thermal regeneration at $140 K onward; 26,29,30,32 Yet, if attempting, on the basis of the observed hf splitting, line FIG. 3.…”
mentioning
confidence: 89%
See 2 more Smart Citations
“…(1) are the electron Zeeman and hyperfine interaction terms, respectively; µ B denotes the Bohr magneton. The obtained A value is about 20% smaller than that known for the isolated As Ga in GaAs [17,18], suggesting that the revealed defect is a complex involving As Ga . The microscopic structure of the complex does not depend on the N composition in the GaN x As 1−x layers for x = 1−3%, as the defect parameters do not change with x.…”
Section: Identificationmentioning
confidence: 99%