Strongly coupled critical current density values achieved in Y1Ba2Cu3O7−δ coated conductors with near-single-crystal texture

Foltyn, S. R.; Arendt, P. N.; Jia, Q. X.; Wang, H.; MacManus‐Driscoll, Judith L.; Kreiskott, Sascha; DePaula, R.F.; Stan, Liliana; Groves, J. R.; Dowden, P. C.

doi:10.1063/1.1584783

Cited by 119 publications

(74 citation statements)

References 16 publications

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“…This may well be due to the better grain to grain alignment and smaller grains found in IBAD type conductors meaning that grain boundaries never significantly control the observed critical current [99]. Rutter et al [100] have used characterisation of the in-plane dependence of the critical current in coated conductors where the substrate system is RABiTS and IBAD to argue that the grain boundary network leads to percolation and thus local current flows which are not aligned with the macroscopic current flow.…”

Section: Field Angle Characterisationmentioning

confidence: 99%

Importance of low-angle grain boundaries in YBa₂Cu₃O_7−δcoated conductors

Durrell¹,

Rutter²

2008

Supercond. Sci. Technol.

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Abstract. Over the past ten years the perception of grain boundaries in YBa 2 Cu 3 O 7−δ conductors has changed greatly. They are no longer a problem to be eliminated but an inevitable and potentially favourable part of the material. This change has arisen as a consequence of new manufacturing techniques which result in excellent grain alignment, reducing the spread of grain boundary misorientation angles. At the same time there is considerable recent evidence which indicates that the variation of properties of grain boundaries with mismatch angle is more complex than a simple exponential decrease in critical current. This is due to the fact that low-angle grain boundaries represent a qualitatively different system to high angle boundaries. The time is therefore right for a targetted review of research into low-angle YBa 2 Cu 3 O 7−δ grain boundaries. This article does not purport to be a comprehensive review of the physics of grain boundaries as found in YBa 2 Cu 3 O 7−δ in general; for a broader overview we would recommend that the reader consult the comprehensive review of Hilgenkamp and Mannhart (Rev. Mod. Phys., 74, 485, 2002). The purpose of this article is to review the origin and properties of the low-angle grain boundaries found in YBa 2 Cu 3 O 7−δ coated conductors both individually and as a collective system.

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Section: Field Angle Characterisationmentioning

confidence: 99%

Importance of low-angle grain boundaries in YBa₂Cu₃O_7−δcoated conductors

Durrell¹,

Rutter²

2008

Supercond. Sci. Technol.

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“…The latter results in formation of low energy grain boundaries, which leads to a microstructure that resembles that of single crystals. 1 This makes biaxially textured films suitable as buffer layers for highly oriented superconducting [1][2][3] and semiconducting [4][5][6] films. The majority of polycrystalline films are today synthesized by vapor condensation with the vapor flux typically arriving parallel with respect to the substrate surface normal at kinetically limited growth conditions.…”

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confidence: 99%

Double in-plane alignment in biaxially textured thin films

Elofsson

Saraiva

Boyd

et al. 2014

Applied Physics Letters

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The scientific interest and technological relevance of biaxially textured polycrystalline thin films stem from their microstructure that resembles that of single crystals. To explain the origin and predict the type of biaxial texture in off-normally deposited films, Mahieu et al. have developed an analytical model [S. Mahieu et al., Thin Solid Films 515, 1229 (2006)]. For certain materials, this model predicts the occurrence of a double in-plane alignment, however, experimentally only a single in-plane alignment has been observed and the reason for this discrepancy is still unknown. The model calculates the resulting in-plane alignment by considering the growth of faceted grains with an out-of-plane orientation that corresponds to the predominant film out-of-plane texture. This approach overlooks the fact that in vapor condensation experiments where growth kinetics is limited and only surface diffusion is active, out-of-plane orientation selection is random during grain nucleation and happens only upon grain impingement. Here, we compile and implement an experiment that is consistent with the key assumptions set forth by the in-plane orientation selection model by Mahieu et al.; a Cr film is grown off-normally on a fiber textured Ti epilayer to pre-determine the out-of-plane orientation and only allow for competitive growth with respect to the in-plane alignment. Our results show unambiguously a biaxially textured Cr (110) film that possesses a double in-plane alignment, in agreement with predictions of the in-plane selection model. Thus, a long standing discrepancy in the literature is resolved, paving the way towards more accurate theoretical descriptions and hence knowledge-based control of microstructure evolution in biaxially textured thin films.

Funding Agencies|Linkoping University

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“…The YBCO films were grown by PLD as described elsewhere. 5 The films on MgO (both IBAD and SCS) have a buffer layer, whose role on the superconducting properties has been described in Ref. 6.…”

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confidence: 99%

“…4 This situation was modified by a recent study showing that CC made by pulsed laser deposition (PLD) on polycrystalline Hastelloy, using an MgO template grown by ion beam assisted deposition (IBAD), have J c s at 75.5 K and self field as large as those of films of the same thickness on SCS. 5 The main reason for the improvement is the better texture of the IBAD template, which leads to an in-plane texture of the YBCO (defined by the full width at half maximum [FWHM] of the X-ray φ scan peak), better than 3°, low enough to preclude the detrimental effect of the higher-angle grain boundaries on J c . This result implies that the current carrying capability of these CC is limited by intra-grain vortex pinning, with the current flowing approximately uniformly across the film width rather than through a percolative path of weak links.…”

mentioning

confidence: 99%

Angular-dependent vortex pinning mechanisms in YBa2Cu3O7 coated conductors and thin films

Civale¹,

Maiorov²,

Serquis³

et al. 2004

Applied Physics Letters

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258

181

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We present a comparative study of the angular dependent critical current density in YBa 2 Cu 3 O 7 films deposited on IBAD MgO and on single crystal MgO and SrTiO 3 substrates. We identify three angular regimes where pinning is dominated by different types of correlated and uncorrelated defects. We show that those regimes are present in all cases, indicating that the pinning mechanisms are the same, but their extension and characteristics are sample dependent, reflecting the quantitative differences in texture and defect density. In particular, the more defective nature of the films on IBAD turns into an advantage as it results in stronger vortex pinning, demonstrating that the critical current density of the films on single crystals is not an upper limit for the performance of the IBAD coated conductors.

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Strongly coupled critical current density values achieved in Y1Ba2Cu3O7−δ coated conductors with near-single-crystal texture

Cited by 119 publications

References 16 publications

Importance of low-angle grain boundaries in YBa₂Cu₃O_7−δcoated conductors

Importance of low-angle grain boundaries in YBa₂Cu₃O_7−δcoated conductors

Double in-plane alignment in biaxially textured thin films

Angular-dependent vortex pinning mechanisms in YBa2Cu3O7 coated conductors and thin films

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Strongly coupled critical current density values achieved in Y1Ba2Cu3O7−δ coated conductors with near-single-crystal texture

Cited by 119 publications

References 16 publications

Importance of low-angle grain boundaries in YBa2Cu3O7−δcoated conductors

Importance of low-angle grain boundaries in YBa2Cu3O7−δcoated conductors

Double in-plane alignment in biaxially textured thin films

Angular-dependent vortex pinning mechanisms in YBa2Cu3O7 coated conductors and thin films

Contact Info

Product

Resources

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Importance of low-angle grain boundaries in YBa₂Cu₃O_7−δcoated conductors

Importance of low-angle grain boundaries in YBa₂Cu₃O_7−δcoated conductors