Strong Fundamental Rejection in Frequency Doublers at 220–260 GHz Using a 250-nm InP HBT Process

Chien, Jeff Shih-Chieh; Lam, Eythan; Tao, Jonathan; Buckwalter, James F.

doi:10.1109/ims40175.2024.10600368

2024 IEEE/MTT-S International Microwave Symposium - IMS 2024 2024

DOI: 10.1109/ims40175.2024.10600368

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Strong Fundamental Rejection in Frequency Doublers at 220–260 GHz Using a 250-nm InP HBT Process

Jeff Shih-Chieh Chien,

Eythan Lam,

Jonathan Tao

et al.

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Strong Fundamental Rejection in Frequency Doublers at 220–260 GHz Using a 250-nm InP HBT Process

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References 13 publications

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