2008
DOI: 10.1364/oe.16.022105
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Strong anomalous optical dispersion of graphene: complex refractive index measured by Picometrology

Abstract: We introduce spinning-disc Picometrology which is designed to measure complex refractive index of ultra-thin and size-limited sample deposited on a solid surface. Picometrology is applied to measure the refractive index of graphene on thermal oxide on silicon. The refractive index varies from ñg = 2.4-1.0i at 532 nm to ñg = 3.0-1.4i at 633 nm at room temperature. The dispersion is five times stronger than bulk graphite (2.67- 1.34i to 2.73-1.42i from 532 nm to 633 nm).

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Cited by 106 publications
(82 citation statements)
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“…Modeling our data results in a similar dispersion, as reported in Ref. 15, and shows the same trend as reported in Ref. 14.…”
Section: -supporting
confidence: 90%
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“…Modeling our data results in a similar dispersion, as reported in Ref. 15, and shows the same trend as reported in Ref. 14.…”
Section: -supporting
confidence: 90%
“…Picometry allows investigations of the optical properties with a higher lateral resolution but is limited to certain wavelengths. 15 Graphene oxide layers have already been characterized by imaging ellipsometry. 16 In this letter, we demonstrate that imaging ellipsometric intensity ͑IEI͒ maps, imaging ellipsometry ͑IE͒, and imaging variable angle spectroscopic ellipsometry ͑IVASE͒ at visible light frequencies are powerful tools to detect and classify graphene flakes and to study their optical properties on a large variety of flat substrates.…”
mentioning
confidence: 99%
“…In order to understand the ablation mechanism, the timedependent temperature of graphene layer under the laser ir- [5,23], whereas the heat capacity of graphene was assumed to be close to bulk graphite in this modelling. The boundary conditions of the graphene on glass model were defined as periodic, thus a large system can be simulated by modelling a small part of it.…”
Section: Resultsmentioning
confidence: 99%
“…However, such features appear after transferring the MLG on SiO 2 /Si substrate ( Figure S2). We note that the typical penetration depth of Raman laser into graphite is ~ 50-100 nm [21][22][23][24] and hence the Raman data in Figure 1b conveys information about the graphene layers away from Ni/MLG interface. These layers are free from any crystal defect as evidenced by the absence of Raman D peak mentioned above.…”
mentioning
confidence: 99%