2013
DOI: 10.1103/physrevb.88.115141
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Strong anisotropic influence of local-field effects on the dielectric response ofα-MoO3

Abstract: Dielectric properties of α-MoO 3 are investigated by a combination of valence electron-energy loss spectroscopy and ab initio calculation at the random phase approximation level with the inclusion of local-field effects (LFE). A meticulous comparison between experimental and calculated spectra is performed in order to interpret calculated dielectric properties. The dielectric function of MoO 3 has been obtained along the three axes and the importance of LFE has been shown. In particular, taking into account LF… Show more

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Cited by 100 publications
(62 citation statements)
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References 77 publications
(105 reference statements)
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“…The inner Ag layer, however, was modified to 35 nm in order to model the experimental modification described above. Transfer matrix calculations for the OPVs were performed using tabulated optical constants of PTB7-Th:PC 71 BM, [26] MoO 3 , [27] ZnO, [28] and ITO. [29] As shown in Figure 3a, the transmission efficiency of the device as a function of TiO x thickness and wavelength displays a dispersion characteristic that closely resembles that of the pure CF (Figure 2a) despite the 10 nm increase in inner Ag layer thickness and addition of high-index dielectric media.…”
Section: Wwwadvopticalmatdementioning
confidence: 99%
“…The inner Ag layer, however, was modified to 35 nm in order to model the experimental modification described above. Transfer matrix calculations for the OPVs were performed using tabulated optical constants of PTB7-Th:PC 71 BM, [26] MoO 3 , [27] ZnO, [28] and ITO. [29] As shown in Figure 3a, the transmission efficiency of the device as a function of TiO x thickness and wavelength displays a dispersion characteristic that closely resembles that of the pure CF (Figure 2a) despite the 10 nm increase in inner Ag layer thickness and addition of high-index dielectric media.…”
Section: Wwwadvopticalmatdementioning
confidence: 99%
“…Low-loss EELS spectra contain many excitation processes including volume and surface plasmons, interband transitions and semi-core states transitions which can confound the identification of specific features (Garcia de Abajo, 2010; Lajaunie et al, 2013;Moreau & Boucher, 2012). XAS and core-loss EELS spectra are also not simple -ionization edges can overlap (Hakouk et al, 2013;Panchakarla et al, 2015) and the physical phenomena behind the white line intensity ratio and near-edge fine structures are highly complex (Krüger, 2010;Mizoguchi et al, 2010;Arenal et al, 2014b;Lajaunie et al, 2015;).…”
Section: Introductionmentioning
confidence: 99%
“…Low-loss EELS spectra can be used to determine the dielectric function, the plasmonic properties, the Young's modulus and for strain mapping of both nanostructures and bulk materials ( Oleshko & Howe, 2007;Arenal et al, 2008;Gu et al, 2010;Oleshko, 2012;Lajaunie et al, 2013;Arenal et al, 2014a).…”
Section: Introductionmentioning
confidence: 99%
“…Larger or smaller values of n were unable to effectively reproduce the energy 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 5 variation of α′ IS over the measured energy range, with the most pronounced differences at energies above 1.5 eV. Although n has not previously been measured for these complex semiconductors, the refined values of n fall between those measured over the energy range of 0.5 -3.0 eV for the binary end members of La 2 O 3 (1.70 -1.75) 20 and MoO 3 (2.07 -2.32) 21 . This suggests that this novel self-referenced method is able to provide reasonable experimental estimates of the refractive indices of complex solids.…”
Section: Resultsmentioning
confidence: 55%