2013
DOI: 10.1039/c3cp50473e
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Stretching single atom contacts at multiple subatomic step-length

Abstract: This work describes jump-to-contact STM-break junction experiments leading to novel statistical distribution of last-step length associated with conductance of a single atom contact. Last-step length histograms are observed with up to five for Fe and three for Cu peaks at integral multiples close to 0.075 nm, a subatomic distance. A model is proposed in terms of gliding from a fcc hollow-site to a hcp hollow-site of adjacent atomic planes at 1/3 regular layer spacing along with tip stretching to account for th… Show more

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Cited by 7 publications
(3 citation statements)
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References 58 publications
(67 reference statements)
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“…The importance of the jump-to-contact strategy is two-fold. First, the Fe clusters have well-defined crystalline structure which in turn establishes the surface structure of the substrate; 31,32 this observation is supported by atom dynamics simulations. 33 Second, the Fe clusters are single domain ferromagnetic particles with strong shape anisotropy.…”
Section: ■ Results and Discussionmentioning
confidence: 75%
“…The importance of the jump-to-contact strategy is two-fold. First, the Fe clusters have well-defined crystalline structure which in turn establishes the surface structure of the substrate; 31,32 this observation is supported by atom dynamics simulations. 33 Second, the Fe clusters are single domain ferromagnetic particles with strong shape anisotropy.…”
Section: ■ Results and Discussionmentioning
confidence: 75%
“…Thus, the different conductance values between contacts with Cu clusters and Au electrodes can be attributed (or at least mainly attributed) to the different electrode material in the junctions. Interestingly, metal clusters created by the ECSTM-BJ approach have well-defined crystallographic structure [39,59].…”
Section: The Influence Of the Metal Electrodementioning
confidence: 99%
“…There are two basic approaches to fabricating such systems: mechanically controlled deformation of thin metallic junctions 8 , 27 30 , and electrochemical techniques 31 37 . In the latter a gap between two electrodes is bridged by the electrochemical deposition of a metal until contact is reached and a nanowire established.…”
Section: Introductionmentioning
confidence: 99%