Abstract:, "Stress measurement of thin film on flexible substrate by using projection moiré method and heterodyne interferometry," Opt. Eng. 55(6), 064102 (2016), doi: 10.1117/1.OE.55.6.064102. Abstract. We propose a stress measurement system based on a projection moiré method and heterodyne interferometry for thin films on a flexible substrate. In the measurement setup, a CMOS camera in which every pixel can receive a series of heterodyne moiré signals by using a continuously relative displacement with a constant velo… Show more
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