1995
DOI: 10.1111/j.1747-1567.1995.tb00842.x
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Stress Mapping: A New Way of Tackling the Characterization of Residual Stresses

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Cited by 6 publications
(2 citation statements)
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“…These instruments are referred to as X-ray diffraction stress instrumentation and are instruments specifically designed for X-ray stress measurements and are not to be confused with conventional X-ray diffraction instruments modified with stress measurement attachments. Measurement times of a few seconds and spatial resolutions of less than one square mm are possible with X-ray diffraction, as well as automated stress mapping [34].…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…These instruments are referred to as X-ray diffraction stress instrumentation and are instruments specifically designed for X-ray stress measurements and are not to be confused with conventional X-ray diffraction instruments modified with stress measurement attachments. Measurement times of a few seconds and spatial resolutions of less than one square mm are possible with X-ray diffraction, as well as automated stress mapping [34].…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…Estos instrumentos son denominados como instrumentación de tensiones por difracción de rayos X y no deben ser confundidos con los instrumentos convencionales de rayos X con accesorios para la medida de tensiones. Medidas en pocos segundos, resoluciones espaciales de menos de 1 mm y mapeados automáticos son posibles con este tipo de instrumentos [Pineault94].…”
Section: Difracción De Rayos Xunclassified