2003
DOI: 10.1063/1.1565177
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Stress-induced suppression of piezoelectric properties in PbTiO3:La thin films via scanning force microscopy

Abstract: Sol-gel derived polycrystalline La-doped PbTiO3 films are investigated by scanning force microscopy (SFM) in a piezoelectric contact mode. The SFM signal proportional to the effective piezoelectric coefficient, deff, is measured inside individual domains as a function of the mechanical force exerted by the SFM tip on the film’s surface. It is found that the piezoelectric signal can be fully suppressed under sufficiently high force (∼20–22 μN). The suppression is qualitatively different for domains of opposite … Show more

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Cited by 67 publications
(37 citation statements)
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References 15 publications
(14 reference statements)
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“…The stages of the polarization switching process, such as domain nucleation and early stages of growth, which are most relevant to applications in highdensity ferroelectric data storage devices, cannot be described using a point charge approximation. Moreover, even though it has been shown that strains produced by the tip may suppress local polarization 12 or induce local ferroelectroelastic polarization switching, electrostatic models do not take into account strain effects. 13,14 Here, we analyze the microscopic mechanisms for electric field-and mechanical stress-induced polarization switching phenomena using recently obtained expressions for the electroelastic fields under the PFM tip, 15 for strong and weak indentation regimes.…”
Section: Introductionmentioning
confidence: 99%
“…The stages of the polarization switching process, such as domain nucleation and early stages of growth, which are most relevant to applications in highdensity ferroelectric data storage devices, cannot be described using a point charge approximation. Moreover, even though it has been shown that strains produced by the tip may suppress local polarization 12 or induce local ferroelectroelastic polarization switching, electrostatic models do not take into account strain effects. 13,14 Here, we analyze the microscopic mechanisms for electric field-and mechanical stress-induced polarization switching phenomena using recently obtained expressions for the electroelastic fields under the PFM tip, 15 for strong and weak indentation regimes.…”
Section: Introductionmentioning
confidence: 99%
“…7 The mechanical load exerted by the tip may change the sign of the effective piezocoefficient. 8 While specific field configuration beneath the tip and spontaneous domain backswitching was suggested by another group 9 as the reason for abnormal domain formation. Similar effect was reported in lithium tantalate crystals but no explanation was proposed.…”
mentioning
confidence: 99%
“…Electrical switching between the oblique and normal domains is usually constrained due to high mechanical stress associated with this type of switching. 8 However, given eight possible polarization directions in rhombohedral grains versus six directions for tetragonal grains, additional possibilities for switching without overcoming mechanical stress exist in rhombohedral grains. Thus, we propose that the abnormal switching effect can be explained by switching between oblique domains in rhombohedral grains, where the final orientation of the out-of-plane polarization component is determined by the charge compensation at the grain boundaries.…”
mentioning
confidence: 99%
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“…Note that in all locations the offset component shows pronounced hysteresis with an "ideal" loop shape. However, the hysteresis loops are significantly shifted in the vertical direction, either due to the presence of frozen polarization layers, 84,85,108 non-uniform stress effects, 106,[109][110][111][112] or contribution of nonlocal bimorph modes. 113 The relaxing part shows almost complete lack of hysteresis, similar to the tip-electrode data in Sec.…”
Section: Relaxation In a Capacitor Structurementioning
confidence: 99%