Stress dependence of the polarized Raman spectrum of polycrystalline lead zirconate titanate

Abstract

The stress dependence of the Raman spectrum of a relaxor-based polycrystalline ferroelectric lead zirconate titanate–lead nickel niobate–lead zinc niobate (PZT–PNN–PZN) has been investigated using polarized Raman microprobe spectroscopy. Emphasis has been placed on explicitly working out the second harmonic equations that relate Raman intensities to the angle between the laser polarization direction and selected crystalline axes. Based on these assessments, the effect under polarized light of crystal orientation on the intensity of selected Raman modes has been rationalized and the obtained experimental data interpreted. Raman spectra were collected with both parallel and cross polarization filters and their dependence on stress calibrated with loading the PZT–PNN–PZN samples in a four-point flexural jig. The use of polarized light allowed us to clarify the effect of domain orientation on the Raman spectrum of PZT–PNN–PZN and to perform precise calibrations of the stress dependence of the A1(TO4) Raman mode, independent of domain orientation in both poled and unpoled PZT–PNN–PZN samples. This study demonstrates the feasibility of microscopic stress (in addition to local domain orientation) evaluations in PZT materials using a polarized Raman microprobe.

High dielectric tunability, electrostriction strain and electrocaloric strength at a tricritical point of tetragonal, rhombohedral and pseudocubic phases

“…It can be seen that the scattering intensity of all modes except the A 1 (LO 3 )/E(LO 4 ) and A 1g modes decreased sharply first and then degraded gradually with the increase of temperature, as shown by the curve of the scattering intensity versus temperature of the representative mode A 1 (LO 2 ) (see the inset of Fig. 2(b)) [18]. Different to that of the representative mode A 1 (LO 2 ), there are three obvious peaks appeared on the curve of the scattering intensity versus temperature for the A 1 (LO 3 )/E(LO 4 ) and A 1g modes.…”

Polarized micro-Raman study of the field-induced phase transition in the relaxor 0.67PbMg1/3Nb2/3O3–0.33PbTiO3 single crystal

“…19 It has been evidenced that the intensities of Raman peaks change periodically when rotating the polarization direction of the incident light with regard to the crystalline axes. 16 Therefore, the bumps in Fig. 2 ͑010͒ plane.…”

“…Therefore, micro-Raman scattering technique has been extensively used to study the local lattice dynamics and the phase transitions in the relaxor ferroelectrics in the past decade. [11][12][13][14][15][16][17] Although the temperature induced phase transitions in PMN-xPT single crystals have been intensively investigated, limited Raman study of the field-induced phase transition in PMN-33%PT single crystal has been reported. In this work, polarized Raman scattering was performed on the ͓001͔-oriented PMN-33%PT single crystal under an applied electric field in order to gain more information about the effects of electric field on the local structure of the relaxor ferroelectric single crystal.…”

Raman polarization studies of highly oriented organic thin films

“…Figure 7 shows the experimental data for I 0 • /I 90 • and the calculated angular dependency using Eqn (14). Thus, we obtained the Euler angles ϕ = 5 • ± 7 • , θ = 89 • ± 5 • and ψ = 0 • ± 8 • which mean that (1) the effective molecular plane of this rather complex structure is tilted with respect to the substrate plane (110) by 89 • ± 5 • , (2) the molecules extend out of the substrate plane with their long axes (σ -configuration) and (3) the molecules are well-aligned to each other and adopt an orientation having their molecular planes parallel to the [001] direction of the substrate.…”