2023
DOI: 10.1140/epjp/s13360-023-04738-z
|View full text |Cite
|
Sign up to set email alerts
|

Stratigraphic mapping of paintings by multispectral reflectography

Alice Dal Fovo,
Raffaella Fontana

Abstract: Despite recent technological advances, it is currently not possible to uniquely and noninvasively measure the micrometric thickness of pictorial layers in paintings. The presence of optically opaque materials (pigments) severely limits the detection capability, as it hinders the penetration of the probe's near-infrared radiation, typically employed for this purpose. In our previous work, we explored the possibility of using diffuse reflectance spectroscopy (DRS) to achieve stratigraphic information about paint… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 22 publications
0
1
0
Order By: Relevance
“…An intrinsic limit of the techniques used in this work is the evaluation of the volumes investigated: in XRF analyses, the thicknesses investigated typically depend on the atoms that make up the material and on their absorption of X radiation; otherwise, reflectance spectrometry is generally indicated as a superficial technique even though we know that in the infrared range, from about 800nm onwards, scattering phenomena are possible which allow us to excite and obtain information on the deeper layers, in the order of micrometres [54]. However, the joint use of techniques that employ different volumes of analysis can lead to obtaining information relating to the inhomogeneity of the sample, which is a typical factor in the context of cultural projects and all those processes of uncontrolled natural degradation, such as the case of patina formation.…”
Section: Discussionmentioning
confidence: 99%
“…An intrinsic limit of the techniques used in this work is the evaluation of the volumes investigated: in XRF analyses, the thicknesses investigated typically depend on the atoms that make up the material and on their absorption of X radiation; otherwise, reflectance spectrometry is generally indicated as a superficial technique even though we know that in the infrared range, from about 800nm onwards, scattering phenomena are possible which allow us to excite and obtain information on the deeper layers, in the order of micrometres [54]. However, the joint use of techniques that employ different volumes of analysis can lead to obtaining information relating to the inhomogeneity of the sample, which is a typical factor in the context of cultural projects and all those processes of uncontrolled natural degradation, such as the case of patina formation.…”
Section: Discussionmentioning
confidence: 99%