Strategies for background subtraction in electron probe microanalysis/x-ray compositional mapping

Myklebust, Robert L.; Newbury, Dale E.; Marinenko, Ryna B.

doi:10.1021/ac00190a005

Cited by 16 publications

(10 citation statements)

References 15 publications

(4 reference statements)

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“…For quantitative mapping, corrections at each pixel for background variations with specimen density are essential. Calculation schemes for removing this specimen-density variation effect have been developed for both WDS and EDS maps~Fiori et al, 1984;Myklebust et al, 1989!. A background map, properly corrected for specimen density variations, should show random intensities in the pixels and should not exhibit evidence of specimen features.…”

Section: Background Subtractionmentioning

confidence: 99%

Tutorial Review: X-ray Mapping in Electron-Beam Instruments

Friel

Lyman

2006

Microsc. Microanal.

123

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This review traces the development of X-ray mapping from its beginning 50 years ago through current analysis procedures that can reveal otherwise obscure elemental distributions and associations. X-ray mapping or compositional imaging of elemental distributions is one of the major capabilities of electron beam microanalysis because it frees the operator from the necessity of making decisions about which image features contain elements of interest. Elements in unexpected locations, or in unexpected association with other elements, may be found easily without operator bias as to where to locate the electron probe for data collection. X-ray mapping in the SEM or EPMA may be applied to bulk specimens at a spatial resolution of about 1 mm. X-ray mapping of thin specimens in the TEM or STEM may be accomplished at a spatial resolution ranging from 2 to 100 nm, depending on specimen thickness and the microscope. Although mapping has traditionally been considered a qualitative technique, recent developments demonstrate the quantitative capabilities of X-ray mapping techniques. Moreover, the long-desired ability to collect and store an entire spectrum at every pixel is now a reality, and methods for mining these data are rapidly being developed.

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Section: Background Subtractionmentioning

confidence: 99%

Tutorial Review: X-ray Mapping in Electron-Beam Instruments

Friel

Lyman

2006

Microsc. Microanal.

123

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“…In mapping, it would be ideal if the entire EDS spectrum could be saved at every picture element so that the same full spectrum procedures could be followed (Myklebust et al 1989;Ingram et al 1998). In mapping, it would be ideal if the entire EDS spectrum could be saved at every picture element so that the same full spectrum procedures could be followed (Myklebust et al 1989;Ingram et al 1998).…”

Section: O 23vmentioning

confidence: 99%

Atomic and Nuclear Analytical Methods

Verma¹

2006

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“…Typically, EDS background corrections in single-point X-ray microanalysis are performed by mathematical filtering (e.g., top-hat digital filtering) or modeling (e.g., Kramers' equation) algorithms, which usually involve the entire spectrum (Goldstein et al, 1992). In mapping, it would be ideal if the entire EDS spectrum could be saved at every picture element so that the same full spectrum procedures could be followed (Myklebust et al, 1989;Ingram et al, 1998). Mapping control software usually allows placing windows across each characteristic peak of interest and defining two or more background windows.…”

Section: Background Correction In Mappingmentioning

confidence: 99%

Logarithmic 3-Band Color Encoding: Robust Method for Display and Comparison of Compositional Maps in Electron Probe X-ray Microanalysis

Newbury

Bright

1999

Microsc Microanal

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Electron-excited X-ray maps recorded with the scanning electron microscope (SEM)/electron probe X-ray microanalyzer (EPMA) are a major method of presenting compositional information. Digitally recorded maps are processed in a variety of ways to improve the visibility of features. Scaling of the recorded signal to match the 8-bit gray-scale intensity range of a typical computer display system is almost always necessary.Inherent limitations of gray-scale displays have led to other intensity-encoding methods for X-ray maps, including clipping, histogram normalization, and pseudocolor scales. While feature visibility is improved by applying these scales, comparisons among image sets are difficult. Quantitative comparisons must be based on standardized intensities corrected for background to produce intensity ratio (k-value) maps. We have developed a new logarithmic, multiband color-encoding method to view these k-value maps more effectively. Three color bands are defined, starting with a dark primary color and grading to a bright pastel: blue = trace (0.001 to 0.01); green = minor (0.01 to 0.1); and red = major (0.1 to 1.0). Within each band, the color is assigned according to a logarithmic scale that depends on intensity ratio or compositional measurements. Logarithmic multiband color encoding permits direct comparisons of maps, such as maps of different elements in the same field of view or maps of the same element in different areas, because the color scale is identical for all maps.

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Strategies for background subtraction in electron probe microanalysis/x-ray compositional mapping

Cited by 16 publications

References 15 publications

Tutorial Review: X-ray Mapping in Electron-Beam Instruments

Tutorial Review: X-ray Mapping in Electron-Beam Instruments

Atomic and Nuclear Analytical Methods

Logarithmic 3-Band Color Encoding: Robust Method for Display and Comparison of Compositional Maps in Electron Probe X-ray Microanalysis

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