2016
DOI: 10.2320/matertrans.mg201616
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Strain Measurement of Micrometre-Sized Structures under Tensile Loading by Using Scanning White-Light Interferometry

Abstract: A scanning white-light interferometry (SWLI) technique was used to image the surface topography and measure the in-plane strain in micrometre-sized structures subjected to uniaxial tensile deformation. This technique was applied to observing the macro and local deformation behaviours in micrometre-sized Au specimens. Reproducible stress-strain curves were successfully obtained using SWLI during the intermittent tensile tests. The local strain distribution was also calculated from the movement of natural gauge … Show more

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Cited by 7 publications
(2 citation statements)
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“…Tensile tests were performed at room temperature under laboratory atmospheric conditions with a displacement rate of 0.1 μm s –1 , corresponding to a strain rate of 2 × 10 –3 s –1 . The set-up has been described in more detail in a previous study 30 . The gauge section of the tensile specimen was monitored during tensile testing using an optical microscope to dynamically measure the strain as a function of time.…”
Section: Methodsmentioning
confidence: 99%
“…Tensile tests were performed at room temperature under laboratory atmospheric conditions with a displacement rate of 0.1 μm s –1 , corresponding to a strain rate of 2 × 10 –3 s –1 . The set-up has been described in more detail in a previous study 30 . The gauge section of the tensile specimen was monitored during tensile testing using an optical microscope to dynamically measure the strain as a function of time.…”
Section: Methodsmentioning
confidence: 99%
“…The gauge section of each specimen was monitored using an optical microscope during tensile testing. The strain measurement 18) was performed using images obtained continuously during tensile testing.…”
Section: Methodsmentioning
confidence: 99%