2000
DOI: 10.1103/physrevb.62.15826
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Strain-induced modulation versus superlattice ordering in epitaxial (GaIn)P layers

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Cited by 4 publications
(4 citation statements)
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“…It is also noted that the TA mode does affect the CP line shape but has no appreciable contribution to the LA mode line profile hence the two phase transition anomalies remain unaffected by its appearance. It is worth mentioning that τ exhibits similar temperature dependence as reported for PMN-35%PT crystal [13].…”
Section: Pm -33%pt Single Crystalsupporting
confidence: 77%
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“…It is also noted that the TA mode does affect the CP line shape but has no appreciable contribution to the LA mode line profile hence the two phase transition anomalies remain unaffected by its appearance. It is worth mentioning that τ exhibits similar temperature dependence as reported for PMN-35%PT crystal [13].…”
Section: Pm -33%pt Single Crystalsupporting
confidence: 77%
“…The overall intensity factor has different meanings in present case because it represents combined effect of CP and TA mode contrary to Ref. 13 where the coupling between CP and TA mode was ignored.…”
Section: Pm -33%pt Single Crystalmentioning
confidence: 82%
“…[14 -16] Furthermore, the degree of CuPt B -type ordering is suppressed in the presence of LCM. [17] Thus, the upward shifts and linewidth broadenings of the InP-and GaP-like LO phonon modes of the SPS samples with n = 1.7 and n = 2 are not due to an increase in the CuPt B -type ordering but are closely related to the occurrence of LCM. Unlike the n = 1 sample, in which an LCM is observed along the [110] direction, [5] the other samples with n = 1.7 and n = 2 suffer from accumulated strain and, as a result, LCM can occur with more complex patterns in these cases.…”
Section: Resultsmentioning
confidence: 99%
“…Bright field imaging under two beam conditions in conventional TEM has been widely used to obtained information about crystalline quality and compositional modulations in semiconductor materials. [14,[21][22][23][24] Although many evidences in literature have shown the ability to quantify composition in ternary semiconductors grown on binary substrates, using high angle annular dark field (HAADF) [25][26][27][28] and electron energy loss spectroscopy (EELS) [29][30][31][32][33] techniques, in quaternary alloys due to that both cat-ion and an-ion can segregate simultaneously, the influence of neighbour column in the intensity value and the intrinsic 2D projection of these techniques make not reliable the quantification of small compositional fluctuations within these hetero-structures so far [4].…”
Section: Introductionmentioning
confidence: 99%