2016
DOI: 10.1088/2053-1583/3/1/011005
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Strain–displacement relations for strain engineering in single-layer 2d materials

Abstract: We investigate the electromechanical coupling in 2d materials. For non-Bravais lattices, we find important corrections to the standard macroscopic strain -microscopic atomic-displacement theory. We put forward a general and systematic approach to calculate strain-displacement relations for several classes of 2d materials. We apply our findings to graphene as a study case, by combining a tight binding and a valence force-field model to calculate electronic and mechanical properties of graphene nanoribbons under… Show more

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Cited by 43 publications
(68 citation statements)
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“…As we have shown, the simple Cauchy-Born relation -often employed in this context -is not a good approximation as it tends to overestimate the strain. Instead, we propose to use strain-displacement relations, which are obtained by minimizing the elastic energy [15]. This approach is easily combined with the microscopic TB model and yields good quantitative agreement.…”
Section: Discussionmentioning
confidence: 99%
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“…As we have shown, the simple Cauchy-Born relation -often employed in this context -is not a good approximation as it tends to overestimate the strain. Instead, we propose to use strain-displacement relations, which are obtained by minimizing the elastic energy [15]. This approach is easily combined with the microscopic TB model and yields good quantitative agreement.…”
Section: Discussionmentioning
confidence: 99%
“…We obtain a very good agreement between fully numerical results (TB and VFM) with analytical estimates resulting from continuum elasticity [16] combined with the derived strain-induced modification of the band-gap given by Eq. (15).…”
Section: Discussionmentioning
confidence: 99%
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“…[12]. This approach relates the VFM to the elastic stretching energy-density in terms of the strain tensor via a minimization procedure.…”
Section: B Elastic Propertiesmentioning
confidence: 99%
“…When accurately parametrized, they can be used to extract the phonon dispersion and elastic properties. Moreover, VFMs can be used to connect the microscopic structure and macroscopic quantities such as strain [12]. In particular, atomic displacements can be related to the macroscopic strain applied to the material, which is a requirement for strain-engineering investigations [11].…”
Section: Introductionmentioning
confidence: 99%