The effects of lattice strain on the magnetic and the transport properties of La Sr MnO Doped colossal-magnetoresistance (CMR) manganite perovskites exhibit a strong correlation between their lattice structure and magneto-transport properties [1]. This phenomenon becomes apparent in thin films. The lattice strain (and stress) accumulated during epitaxial growth of a film plays an important role in the formation of the spin-and the charge-ordered states, the metal-insulator transition temperature, and the value of magnetoresistance [2][3][4].The effect of the kind of single-crystal substrate on the magnetic and the electronic properties of manganite films has been investigated well [5,6]. On the other hand, to develop hybrid devices based on multilayered CMR films detailed information on the mutual influence between constituent layers is required. It is expected that the magnetic and the transport properties of a multilayer structure can substantially differ from those of the individual films of the constituent layers. In this work we report experimental results for La Sr MnO 3 bilayer (BL). All films were prepared by rf magnetron sputtering using a so-called «soft» (or powder) target [7]. The total pressure in the chamber was 5 10 2 × -Torr with a 3:1 Ar-O 2 gas mixture. The substrate was a LaAlO 3 (001) single crystal (LAO) with an out-of-plane lattice parameter c 0.379 nm for pseudocubic symmetry. The substrate temperature during deposition was 750°C. Both LSM and LCM films were deposited with a thickness d 60 nm, and the BL was deposited with the same thickness for each layer and with LSM on top. The q-2q x-ray diffraction (XRD) patterns were obtained using a Rigaku diffractometer and CuK a radiation. The lattice parameters evaluated directly from the XRD data were plotted against cos sin 2 q q /. A more precise determination of the lattice parameter was obtained extrapolating a straight line to cos sin 2 0 q q / = . The resistance measurements were carried out using the four-probe method in the temperature range of 4.2-300 K and a magnetic fields up to 5 T. The magnetization in a field up to 100 Oe and the susceptibility at 500 Hz were obtained with a Quantum Design SQUID magnetometer in the temperature range of 4.2-300 K. Figure 1,a presents the q-2q XRD scans for LSM (curve 1), LCM (curve 2) and BL (curve 3) films. The high intensities of the (00l) peaks show that the deposition results in highly c-oriented films. Figure 1,b shows that the location of the (002) Bragg peak for the BL is almost coincident with that for the LCM film. In contrast, the peak for the LSM film is dis-