When the picture of L255 is pressed or slid, the cell gap is changed and the arrangement of liquid crystal molecules(LC) is disordered, resulting in the decrease of the brightness of the corresponding position, which cannot be recovered within the specified time (≤5s), it is called trace Mura. In this paper, the principle of trace Mura is introduced in detail, and a new simulation model is proposed. Using TechWiz software, the risk of trace Mura can be accurately simulated and quantified, and the simulation results are consistent with the actual phenomena. It is confirmed that the square angle of LC at the end of the electrode is changed suddenly (i.e. the opposite direction of the normal deflection direction of LC), and the mutation angle is −20°, which prone to trace Mura. In addition, four groups of influence factors (total 12 splits) are proposed for physical and simulation verification, and the optimized design scheme of pixel electrode is obtained. The following conclusions are obtained: the inner corner is cancelled, the length of the outer corner is ≥ 3um, and the angle of the outer corner on the right side (which has been referred to in Figure 4, and other pixel directions can be adjusted accordingly) is ≥ 45°, and the turning direction of the left side is in the same direction as the slit or at an acute angle with the slit direction; This scheme can reduce the dark area of the opening area and maximize the transmittance without risk of trace Mura.