Storage and Counter Based Logic Built-In Self-Test
Irith Pomeranz
Abstract:Recent reports of silent data corruption because of hardware faults in large data centers bring to the forefront the importance of in-field testing. In-field testing, enabled by logic built-in self-test (LBIST ), addresses defects that occur during the lifetime of a chip and ones that escaped manufacturing tests. A class of LBIST approaches for scan circuits store partitioned deterministic test data on-chip and produce tests by combining stored test data entries in one of two ways: (1) pseudo-random combinatio… Show more
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