1990
DOI: 10.1142/s021798499000177x
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STM Study of Polycrystalline Copper

Abstract: Grain boundaries and their electric potential were studied in connection with the electric conduction in polycrystalline copper using a scanning tunneling microscope (STM). It was found that the grain boundaries consist mainly of cuprous oxide ( Cu 2 O ) and electric potential barriers are formed at most grain boundaries.

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