2009
DOI: 10.1016/j.eswa.2008.02.066
|View full text |Cite
|
Sign up to set email alerts
|

Stitching defect detection and classification using wavelet transform and BP neural network

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
57
0

Year Published

2012
2012
2018
2018

Publication Types

Select...
4
3

Relationship

0
7

Authors

Journals

citations
Cited by 106 publications
(57 citation statements)
references
References 23 publications
0
57
0
Order By: Relevance
“…As customers nowadays have a stronger negotiating power, providing them better quality products/services with a reasonable price becomes ever so critical to the survival and development of every business organization [41,42]. Lee et al [43] indicated that a failure in achieving customers' expected quality will lead to a long production cycle time, an increase in production and warranty cost, as well as a significant defection in the number of customers.…”
Section: Practical Applicationmentioning
confidence: 99%
See 2 more Smart Citations
“…As customers nowadays have a stronger negotiating power, providing them better quality products/services with a reasonable price becomes ever so critical to the survival and development of every business organization [41,42]. Lee et al [43] indicated that a failure in achieving customers' expected quality will lead to a long production cycle time, an increase in production and warranty cost, as well as a significant defection in the number of customers.…”
Section: Practical Applicationmentioning
confidence: 99%
“…Literally, Wong et al [41] provided a critical review of several approaches in detecting different defects and found that their focus was mainly on defect detection instead of defect diagnosis to identify root causes of defects and implement corrective actions. Lee et al [43] further pinpointed that the existing detection methods treat defects individually without considering their relationships.…”
Section: Practical Applicationmentioning
confidence: 99%
See 1 more Smart Citation
“…As computer technology develops, rapid image processing and pattern recognition can be performed quickly and inexpensively. It therefore becomes increasingly popular for computer aided feature extraction, defect detection, quality classification and decision making (Deng et al, 2011;Han & Shi, 2007;Liu et al, 2011a;Liu et al, 2011b;Mak & Peng, 2008;Mak et al, 2009;Wong et al, 2009;Zhang et al, 2010b) in the textile field. Thus, it is the trend that automated image-based inspection replaces human inspection, and improved feature extraction methods will accelerate the process.…”
Section: Introductionmentioning
confidence: 99%
“…Texture analysis has played an important role in the automatic visual inspection of textile surfaces. Among many methods, the wavelet transform tool has been studied for analysing images and extracting important information for improved pattern recognition (Deng et al, 2011;Han & Shi, 2007;Liu et al, 2011a;Ngan et al, 2005;Wong et al, 2009;Zhang et al, 2007Zhang et al, , 2010b.…”
Section: Introductionmentioning
confidence: 99%