STEM EBIC to Study 2D Materials

Nanoscale Mapping of Interfacial Electrical Transport in Graphene-MoS 2 Heterostructures with STEM-EBIC

“…Since these interfaces are buried, characterizing them is challenging; current methods are either indirect, or can only demonstrate a correlation of debris with poor device performance. In an extension of previous work [2], here we describe a powerful technique to study the quality of buried interfaces: STEM-EBIC combines local transport measurements with plan-view imaging to reveal the direct impact interfacial nanoscale debris has on device performance.…”