2020
DOI: 10.1103/physrevb.102.075312
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Statistically modeling optical linewidths of nitrogen vacancy centers in microstructures

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Cited by 20 publications
(35 citation statements)
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“…This result emphasizes the excellent optical quality and low charge-noise environment of the created NV centers. Similar probability values are obtained by using a Bayesian approach for analyzing linewidth distributions [26]; with this approach, we determine the probability that the next measured line has a linewidth below 100 MHz of 93.4%, 92.0%, and 77.7% for sample A, B, and C, respectively. With the same approach we also calculate the probability that the median of the distributions is below this threshold, giving a probability of above 99.9% for each of the three samples.…”
Section: Linewidth Characterizationmentioning
confidence: 95%
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“…This result emphasizes the excellent optical quality and low charge-noise environment of the created NV centers. Similar probability values are obtained by using a Bayesian approach for analyzing linewidth distributions [26]; with this approach, we determine the probability that the next measured line has a linewidth below 100 MHz of 93.4%, 92.0%, and 77.7% for sample A, B, and C, respectively. With the same approach we also calculate the probability that the median of the distributions is below this threshold, giving a probability of above 99.9% for each of the three samples.…”
Section: Linewidth Characterizationmentioning
confidence: 95%
“…A recent study demonstrated progress in obtaining NV centers with linewidths of approximately 200 MHz in 3.8 µm-thick diamond membranes [17]. In even thinner structures, linewidths down to 250 MHz were reported with a new approach based on implanting nitrogen after micro-structuring [26] and also in samples structured with a slow etching procedure [30]. To the best of our knowledge, narrower linewidths than these have never been reported in micron-thick diamond.…”
Section: Introductionmentioning
confidence: 98%
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“…This inhomogeneous broadening of the ZPL is a consequence of a fluctuating charge environment presumably caused by fabrication-induced surface damage [41,44]. Increasing the quality of the crystalline environment has proven to be beneficial [53][54][55].…”
Section: Introductionmentioning
confidence: 99%