2023
DOI: 10.1109/access.2023.3279307
|View full text |Cite
|
Sign up to set email alerts
|

Statistically Inspired Passivity Preserving Model Order Reduction

Abstract: The continuous scaling of the on-chip devices and interconnects increases the complexity of the design space and becomes a crucial factor in the fabrication of modern integrated circuits. The ever decreasing of interconnect pitch along with process enhancement into the nanometer regime had shifted the paradigm from a device-dominated to an interconnect-dominated methodology. In the design methodology, Model Order Reduction (MOR) reduces the size of large-scale simulation of on-chip interconnect to speed up the… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2023
2023
2023
2023

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 49 publications
0
0
0
Order By: Relevance