Statistical test: A new paradigm to improve test effectiveness & efficiency

Economic Analysis of Testing Homogeneous Manycore Chips

“…The imperfect manufacturing test process leads to both test escapes (i.e., bad chips pass the test) and false rejects (i.e., good chips fail the test, also known as test overkill), which is related to the effectiveness of the test decision criterion µ [27]. Generally speaking, the more patterns applied to the circuits (for higher defect coverage), the more false rejects occur, and the steepness is described by parameter ν.…”

“…a) The effectiveness of the test decision criterion µ. b) The parameter v that sets the steepness of the fallout curve that shows the probability for defects to be detected when test patterns are gradually applied [27]. c) The product quality requirement for the maximum test escape percentage τ (e.g., τ = 0.0005 for 500 DPPM).…”

“…Substituting (27) into this expression yields the manufacturing cost per fabricated core of the chip with redundancy…”

“…Also, depending on the effectiveness of the decision criterion µ, the correlation between B r and G r can be expressed as [27] B r = 1 − e…”

“…Note that, this equation is used to describe the right general shape instead of an accurate representation of any decision process, as pointed out in [27]. To model a particular decision process, we can resort to curve fitting techniques to obtain the parameter µ.…”