2012
DOI: 10.1016/j.microrel.2012.06.039
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Statistical model of NBTI and reliability simulation for analogue circuits

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Cited by 1 publication
(2 citation statements)
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“…An enhanced single-pass method for digital combinational circuit reliability analysis was introduced by Seyyed & Mohammadi (2011) [208]. LV et al (2012) [209] presented a framework for conducting analogue reliability simulations, enabling reliability to be addressed as early as the design phase.…”
Section: Reliability Block Diagrams (Rbd)mentioning
confidence: 99%
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“…An enhanced single-pass method for digital combinational circuit reliability analysis was introduced by Seyyed & Mohammadi (2011) [208]. LV et al (2012) [209] presented a framework for conducting analogue reliability simulations, enabling reliability to be addressed as early as the design phase.…”
Section: Reliability Block Diagrams (Rbd)mentioning
confidence: 99%
“…An enhanced single-pass method for digital combinational circuit reliability analysis was introduced by Seyyed & Mohammadi (2011) [208]. LV et al (2012) [209] presented a framework for conducting analogue reliability simulations, enabling reliability to be addressed as early as the design phase. They also proposed a statistical model of Negative bias temperature instability (NBTI), which encompasses all the fluctuations resulting from circuit use conditions.…”
Section: Reliability Block Diagrams (Rbd)mentioning
confidence: 99%