Statistical methods of determining the QD dimensions based on atomic force microscopy measurements

Piotrowski, T.; Kaczmarczyk, Mariusz

doi:10.1007/s10854-008-9656-7

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2009

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“…The dimensions of quantum dots (QDs) are usually deter− mined using transmission electron microscopy (TEM) [1,2] scanning tunnelling microscopy (STM) [3] and atomic force microscopy (AFM) [4,5]. Most popular are AFM measure− ments as this method is simple, fast and does not require so− phisticated sample preparation.…”

Section: Introductionmentioning

confidence: 99%

Influence of quantum dots shape approximation on size reconstructed from atomic force microscopy measurements

Piotrowski

Sikorski

2009

Opto-Electronics Review

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In this work we discuss the influence of the atomic force microscopy (AFM) probe tip geometry and the object — quantum dot form on the quantum dots dimension in the growth plane reconstructed from the AFM measurements. It is shown that ignoring the geometry of the probe tip and the quantum dot leads to significant differences between dimensions obtained from the AFM measurements and the real dimensions. Inaccuracies in QD size determination of the nano-objects from AFM measurements are defined.

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