2010 International Conference on Intelligent and Advanced Systems 2010
DOI: 10.1109/icias.2010.5716155
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Statistical features-ANN recognizer for bivariate process mean shift pattern recognition

Abstract: -Artificial neural network (ANN)-based recognizers have been developed for monitoring and diagnosis bivariate process mean shift in multivariate statistical process control (MSPC). They have better average run lengths (ARLs) performance in monitoring process mean shifts and gave an useful diagnosis information compared to the traditional MSPC schemes such as T 2 , multivariate cumulative sum (MCUSUM) and multivariate exponentially weighted moving average (MEWMA). The existing recognizers are raw databased, whe… Show more

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