Statistical dynamical theory of X-ray diffraction in the Bragg case: application to triple-crystal diffractometry

Pavlov, Konstantin Mikhailovitch; Пунегов, В. И.

doi:10.1107/s0108767399016694

Cited by 67 publications

(28 citation statements)

References 32 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…18 and references therein). There is a large variety of crystallographic systems for which characterisation requires statistical diffraction theory approaches.…”

Section: Introductionmentioning

confidence: 99%

Deterministic Bragg Coherent Diffraction Imaging

Pavlov

Пунегов

Morgan

et al. 2017

Sci Rep

Self Cite

View full text Add to dashboard Cite

A deterministic variant of Bragg Coherent Diffraction Imaging is introduced in its kinematical approximation, for X-ray scattering from an imperfect crystal whose imperfections span no more than half of the volume of the crystal. This approach provides a unique analytical reconstruction of the object’s structure factor and displacement fields from the 3D diffracted intensity distribution centred around any particular reciprocal lattice vector. The simple closed-form reconstruction algorithm, which requires only one multiplication and one Fourier transformation, is not restricted by assumptions of smallness of the displacement field. The algorithm performs well in simulations incorporating a variety of conditions, including both realistic levels of noise and departures from ideality in the reference (i.e. imperfection-free) part of the crystal.

show abstract

“…18 and references therein). There is a large variety of crystallographic systems for which characterisation requires statistical diffraction theory approaches.…”

Section: Introductionmentioning

confidence: 99%

Deterministic Bragg Coherent Diffraction Imaging

Pavlov

Пунегов

Morgan

et al. 2017

Sci Rep

Self Cite

View full text Add to dashboard Cite

show abstract

“…Fundamental theory connected with the structure analysis from the shape of RLP for distorted crystals is given by Fewster [4] and by Chiercia et al [5]. Another approaches rely on statistical scattering [6,7] and Williamson-Hall theory [8]. In the present paper mainly geometrical aspects of the defected structure is used in RLP simulation.…”

Section: Resultsmentioning

confidence: 99%

X‐ray characterization of thick GaN layers grown by HVPE

Korbutowicz¹,

Kozłowski²,

Dumiszewska³

et al. 2005

Cryst. Res. Technol.

View full text Add to dashboard Cite

The crystallographic structures of the various Metalorganic Vapour Phase Epitaxy (MOVPE) thin GaN epitaxial layers deposited on (00.1) sapphire substrates are described and compared with the structural properties of the thick gallium nitride layers deposited by Hydride Vapour Phase Epitaxy (HVPE) on the top of them. The crystallographic structure and the quality of epitaxial GaN layers obtained in this way are determined. Additionally thick HVPE GaN layers deposited on these composite substrates (MOVPEGaN/sapphire) are compared with the thick HVPE GaN layers grown directly on sapphire substrates. It was found that HVPE thick GaN epilayers on sapphire are comparable with the HVPE thick GaN layers deposited on composite substrates.

show abstract

“…£ ÑÃÜÇÏ ÔÎÖÚÂÇ ÍÂÍ AEË××ÖÊÐÑÇ, ÕÂÍ Ë ÍÑÅÇÓÇÐÕÐÑÇ ÓÂÔÔÇâÐËÇ ÒÓËÔÖÕÔÕÄÖáÕ Ä ÔÎÑÉÐÑÏ ÒÓÑÙÇÔÔÇ AEËÐÂÏËÚÇ-ÔÍÑÌ AEË×ÓÂÍÙËË Ë ÑÒËÔÞÄÂáÕÔâ ÔËÔÕÇÏÑÌ ËÐÕÇÅÓÑ-AEË×-×ÇÓÇÐÙËÂÎßÐÞØ ÖÓÂÄÐÇÐËÌ [37]. ±ÑÎÖÒÓÑÄÑAEÐËÍÑÄÞÇ ÍÓËÔÕÂÎÎÞ ÑÒÕÑ-Ë ÐÂÐÑàÎÇÍÕÓÑÐËÍË ÒÓÇËÏÖÜÇÔÕÄÇÐÐÑ ËÔÔÎÇAEÖáÕÔâ Ä ÅÇÑÏÇÕÓËË ¢ÓàÅÅÂ, ÒÑàÕÑÏÖ AEË××ÖÊÐÑÇ ÓÂÔÔÇâÐËÇ ÏÑÉÐÑ ÑÒËÔÞÄÂÕß Ä ÍËÐÇÏÂÕËÚÇÔÍÑÏ (ÃÑÓÐÑÄ-ÔÍÑÏ) ÒÓËÃÎËÉÇÐËË ÃÇÊ ÖÚÈÕÂ âÄÎÇÐËÌ ÄÕÑÓËÚÐÑÌ àÍÔ-ÕËÐÍÙËË.…”

Section: ³õâõëôõëúçôíââ õçñóëâ óçðõåçðñäôíñì Aeë×óâíùëëunclassified

High-resolution X-ray diffraction in crystalline structures with quantum dots

Пунегов¹

2015

Usp. Fiz. Nauk

View full text Add to dashboard Cite

Statistical dynamical theory of X-ray diffraction in the Bragg case: application to triple-crystal diffractometry

Cited by 67 publications

References 32 publications

Deterministic Bragg Coherent Diffraction Imaging

Deterministic Bragg Coherent Diffraction Imaging

X‐ray characterization of thick GaN layers grown by HVPE

High-resolution X-ray diffraction in crystalline structures with quantum dots

Contact Info

Product

Resources

About