Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy

Monti, Tamara; Udoudo, Ofonime; Sperin, K.A.; Dodds, Chris; Kingman, S.W.; Jackson, Trevor

doi:10.1109/tmtt.2016.2642940

Cited by 3 publications

(1 citation statement)

References 27 publications

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“…If high spatial resolution is desired in respect to the measurement wavelength, a probe is required to concentrate the field and overcome the Abbe diffraction limit by means of evanescent waves. At GHz frequencies, the scanning microwave microscope (SMM) frequently uses coaxial resonant probes whose quality factor and resonance can be related to the interaction with the sample [8]- [10], or AFM tips [11]- [13] that can be modeled electromagnetically in 3D [14]- [16]. The latter technique is also used in the millimeter wave (mmW) region, which is the realm where it is possible to combine optical and microwave techniques, for example the joint use of propagating waves [17] and guided waves coupled to specific probes including small antennae capable of concentrating the electric or magnetic field with a very high resolution [18]- [20].…”

Section: Introductionmentioning

confidence: 99%

Near-Field Millimeter Wave Vector Measurements -- Experimental Design & Measurement Interpretation

Chusseau¹,

Thibaut²,

Raoult³

2021

Preprint

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Near-field imaging experiments exist both in optics and microwaves with often different methods and theoretical supports. For millimeter waves or THz waves, techniques from both fields can be merged to identify materials at the micron scale on the surface or in near-surface volumes. The principle of such nearfield vector imaging at the frequency of 60 GHz is discussed in detail here. We develop techniques for extracting vector voltages and methods for extracting the normalized near-field vector reflection on the sample. In particular, the subharmonic IQ mixer imbalance, which produced corrupted outputs either due to amplitude or phase differences, must be taken into account and compensated for to avoid any systematic errors. We provide a method to fully characterize these imperfections and to isolate the only contribution of the near-field interaction between the probe and the sample. The effects of the mechanical modulation waveform and harmonic rank used for signal acquisition are also discussed.

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