2021
DOI: 10.1016/j.commatsci.2021.110616
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Statistical analysis of effective electro-mechanical properties and percolation behavior of aligned carbon nanotube/polymer nanocomposites via computational micromechanics

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Cited by 19 publications
(44 citation statements)
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“…Considerable effort has also been devoted to the development of piezoresistivity modelscomputational and/or analytical means of predicting how conductivity changes for a prescribed strain. These efforts can be broadly categorized as (i) equivalent resistor network models [260][261][262], (ii) computational micro-mechanics models [254,[263][264][265], or (iii) homogenized macroscale models [266][267][268]. In (i) equivalent resistor network models, high aspect ratio fillers such as CNTs are represented as either straight or wavy/curved sticks in a micro-domain [260][261][262].…”
Section: (A) Piezoresistive Nanocompositesmentioning
confidence: 99%
See 1 more Smart Citation
“…Considerable effort has also been devoted to the development of piezoresistivity modelscomputational and/or analytical means of predicting how conductivity changes for a prescribed strain. These efforts can be broadly categorized as (i) equivalent resistor network models [260][261][262], (ii) computational micro-mechanics models [254,[263][264][265], or (iii) homogenized macroscale models [266][267][268]. In (i) equivalent resistor network models, high aspect ratio fillers such as CNTs are represented as either straight or wavy/curved sticks in a micro-domain [260][261][262].…”
Section: (A) Piezoresistive Nanocompositesmentioning
confidence: 99%
“…Second, (ii) computational micro-mechanics models use computational means to simulate both phases of the composite-the non-conductive matrix and the conductive fillers [254,[263][264][265]. Because of this, and unlike equivalent resistor network models, computational micro-mechanics models can incorporate nuanced effects such as nanofiller-to-matrix debonding, nanofiller deformation, etc.…”
Section: (A) Piezoresistive Nanocompositesmentioning
confidence: 99%
“…The estimates for piezoresistive coefficients are validated by comparison with experimentally reported gage factors. The present study builds upon a closely related initial work by Talamadupula and Seidel [ 8 ] that focused on the statistical characterization of these same properties for the special case of aligned, straight CNTs. Results from Talamadupula and Seidel [ 8 ] are presented here for comparison purposes with the imperfectly aligned, randomly oriented results and also results with varying degrees of waviness.…”
Section: Introduction Motivation and Backgroundmentioning
confidence: 97%
“…The present study builds upon a closely related initial work by Talamadupula and Seidel [ 8 ] that focused on the statistical characterization of these same properties for the special case of aligned, straight CNTs. Results from Talamadupula and Seidel [ 8 ] are presented here for comparison purposes with the imperfectly aligned, randomly oriented results and also results with varying degrees of waviness. A few modeling details repeated from [ 8 ] and some Supplementary Data with discussion are presented in the Supplementary Materials .…”
Section: Introduction Motivation and Backgroundmentioning
confidence: 97%
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